Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

The Emergence of Aberration Correctors for Electron Lenses

Some Chicago Aberrations

Correction of Aberrations—Past, Present and Future

Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science

Applications of a Cs Corrected HRTEM in Materials Science

Benefits and Possibilities of Cc–Correction for TEM / STEM

Sub-Angstrom Probe Size in HADF-STEM at 120KV

The Ultimate Resolution in Aberration-Corrected STEM

Enhancing the Resolution and Sensitivity of STEM by Aberration Correction

STEM Aberration Correction: Where Next?

Electron holography – where we are and where to go

Effects of Fresnel Corrections for Phase-Shifting Electron Holography

Bright Electron Beams and Their Applications to Electron Phase Microscopy

Low Voltage Electron Holography - High Voltage Electron Holography

Holographic Observation of Magnetic Fine-Structures in New Magnetic Materials

Contributions of Elastically and Inelastically Scattered Electrons to High–Resolution Off–Axis Electron Holograms – a Quantitative Analysis

Contributions of Elastically and Inelastically Scattered Electrons to High-Resolution Off-Axis Electron Holograms – a Quantitative Analysis

Mapping of Process Induced Dopant Redistributions by Electron Holography

Electron Holographic Characterization of Nanoscale Magnetic and Electrostatic Fields

Electron Holographic Characterization of Nanoscale Magnetic and Electrostatic Fields

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract