28 results
A FIB-SEM Based Correlative Methodology for X-Ray Nanotomography and Secondary Ion Mass Spectrometry: An Application Example in Lithium Batteries Research
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- Microscopy and Microanalysis / Volume 28 / Issue 6 / December 2022
- Published online by Cambridge University Press:
- 08 September 2022, pp. 1890-1895
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- December 2022
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4D Reconstructions from Microscale Photogrammetry: Correlation of 3D Surface Representations with SIMS to Link Microstructural Topography and Chemical Information
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 252-254
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- August 2022
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Imaging and Quantification of Hydrogen in Materials: SIMS Based Correlative Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1606-1607
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- August 2022
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Elucidation of 3D Chemical and Physical Architecture of Soil Microstructures by Correlating Spectro-Microscopic Techniques and Developing Novel Computational Methods
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 912-913
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- August 2022
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SIMS Imaging Performed on Focused Ion Beam - based Platforms
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 944-946
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- August 2022
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SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 30-31
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- August 2022
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Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 34-35
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- August 2022
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Transmission ion microscopy and time-of-flight spectroscopy
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1930-1932
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- August 2021
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In-situ multi-modal microscopy using finely focused ion and electron beams
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 308-309
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- August 2021
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New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 770-772
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- August 2021
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Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1008-1010
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- August 2021
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Correlative Electron Microscopy, High Resolution Ion Imaging and Secondary Ion Mass Spectrometry for High Resolution Nanoanalytics on Biological Tissue
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 818-820
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- August 2020
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Advanced Analytical Capabilities on FIB Instruments Using SIMS
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 82-83
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- August 2020
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Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1972-1974
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- August 2020
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npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1976-1977
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- August 2020
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A method for quantitative nanoscale imaging of dopant distributions using secondary ion mass spectrometry: an application example in silicon photovoltaics
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- MRS Communications / Volume 9 / Issue 3 / September 2019
- Published online by Cambridge University Press:
- 28 August 2019, pp. 916-923
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- September 2019
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Characterization of Biogenic Nanoparticles Via In-Situ Correlative Secondary Electron Helium Microscopy and Secondary Ion Mass Spectrometry
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1062-1063
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- August 2019
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In situ Correlative Helium Ion Microscopy and Secondary Ion Mass Spectrometry for High-Resolution Nano-Analytics in Life Sciences
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1026-1027
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- August 2019
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Characterization of Materials for Energy Storage and Production by Helium Ion Microscopy Coupled to Secondary Ion Mass Spectrometry
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 888-889
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- August 2019
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Nanoscale Correlative Imaging of Low-Z elements by in-situ Secondary Ion Mass Spectrometry in a Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1778-1779
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- August 2019
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