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Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging

Published online by Cambridge University Press:  30 July 2021

Tom Wirtz ,
Olivier De Castro ,
Hung Quang Hoang ,
Luca Cressa ,
Santhana Eswara ,
Antje Biesemeier  and
Jean-Nicolas Audinot
Tom Wirtz
Affiliation:
1Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Olivier De Castro
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg
Hung Quang Hoang
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg
Luca Cressa
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg
Santhana Eswara
Affiliation:
Luxembourg Institute of Science and Technology, Belvaux, Luxembourg
Antje Biesemeier
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Belvaux, Not Applicable, Luxembourg
Jean-Nicolas Audinot
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1008 - 1010
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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www.npscope.eu. This project has received funding from the European Union's Horizon 2020 Research and Innovation Programme under grant agreement No. 720964Google Scholar
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