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Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging

Published online by Cambridge University Press:  30 July 2021

Tom Wirtz
Affiliation:
1Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Olivier De Castro
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg
Hung Quang Hoang
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg
Luca Cressa
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg
Santhana Eswara
Affiliation:
Luxembourg Institute of Science and Technology, Belvaux, Luxembourg
Antje Biesemeier
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Belvaux, Not Applicable, Luxembourg
Jean-Nicolas Audinot
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg
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Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Wirtz, T., Philipp, P., Audinot, J.-N., Dowsett, D., Eswara, S., Nanotechnology 26 (2015) 434001CrossRefGoogle Scholar
Vollnhals, F., Audinot, J.-N., Wirtz, T., Mercier-Bonin, M., Fourquaux, I., Schroeppel, B., Kraushaar, U., Lev-Ram, V., Ellisman, M. H., Eswara, S., Anal. Chem. 89 (2017) 10702CrossRefGoogle Scholar
Dowsett, D., Wirtz, T., Anal. Chem. 89 (2017) 8957CrossRefGoogle Scholar
Wirtz, T., De Castro, O., Audinot, J.-N., Philipp, P., Ann. Rev. Anal. Chem. 12 (2019)CrossRefGoogle Scholar
Serralta, E., Klingner, N., De Castro, O., Mousley, M., Eswara, S., Duarte Pinto, S., Wirtz, T., Hlawacek, G., Beilstein J. Nanotechnol. 11 (2020) 1854-1864CrossRefGoogle Scholar
www.npscope.eu. This project has received funding from the European Union's Horizon 2020 Research and Innovation Programme under grant agreement No. 720964Google Scholar
Eswara, S., Pshenova, A., Yedra, L., Hoang, Q. H., Lovric, J., Philipp, P., Wirtz, T., Appl. Phys. Revs. 6 (2019) 021312CrossRefGoogle Scholar
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