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Transmission ion microscopy and time-of-flight spectroscopy

Published online by Cambridge University Press:  30 July 2021

Michael Mousley ,
Wolfhard Moeller ,
Patrick Philipp ,
Olivier Bouton ,
Nico Klingner ,
Eduardo Serralta ,
Gregor Hlawacek ,
Tom Wirtz  and
Santhana Eswara
Michael Mousley
Affiliation:
Luxembourg Institute of Science and Technology, Belvaux, Luxembourg
Wolfhard Moeller
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf, dresden, Germany
Patrick Philipp
Affiliation:
Luxembourg Institute of Science and Technology, Belvaux, Luxembourg
Olivier Bouton
Affiliation:
Luxembourg Institute of Science and Technology, Belvaux, Luxembourg
Nico Klingner
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf, United States
Eduardo Serralta
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf, United States
Gregor Hlawacek
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Sachsen, Germany
Tom Wirtz
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Santhana Eswara
Affiliation:
Luxembourg Institute of Science and Technology, Belvaux, Luxembourg

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1930 - 1932
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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