Hostname: page-component-76fb5796d-zzh7m Total loading time: 0 Render date: 2024-04-25T14:59:50.625Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Biogenic Nanoparticles Via In-Situ Correlative Secondary Electron Helium Microscopy and Secondary Ion Mass Spectrometry

Published online by Cambridge University Press:  05 August 2019

Christelle Guillermier ,
David Medina Cruz ,
Jean-Nicolas Audinot  and
Tom Wirtz
Christelle Guillermier*
Affiliation:
Carl Zeiss SMT, Inc., One Corporation Way, Peabody, MA, USA.
David Medina Cruz
Affiliation:
Nanomedicine Science and Technology Center, Northeastern University, Boston, MA, USA.
Jean-Nicolas Audinot
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
Tom Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
*
*Corresponding author: christelle.guillermier@zeiss.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Multi-Modal, Large-Scale and 3D Correlative Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1062 - 1063
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Medina Cruz, David, Mi, Gujie, and Webster, Thomas J.. Journal of Biomedical Materials Research Part A 106.5 (2018), 1400-1412.Google Scholar
[2]Hlawacek, G., Gölzhäuser, A., Helium Ion Microscopy, Springer, 2017.Google Scholar
[3]Wirtz, T., Philipp, P., Audinot, J.-N., Dowsett, D., Eswara, S., Nanotechnology 26 (2015), 434001.Google Scholar
[4]Wirtz, T., Dowsett, D. and Philipp, P. in “SIMS on the Helium Ion Microscope: A Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics”. In: Hlawacek, G.Gölzhäuser, , A. (eds) Helium Ion Microscopy (Springer, Cham) 297.Google Scholar
[5]Dowsett, D., Wirtz, T., Anal. Chem. 89 (2017), 8957.Google Scholar
[6]Wirtz, T., De Castro, O., Audinot, J.-N., and Philipp, P., Annual Review of Analytical Chemistry 12 (2019)Google Scholar
[5]Gratia, P., Grancini, G., Audinot, J.-N., Jeanbourquin, X., Mosconi, E., Zimmermann, I., Dowsett, D., Lee, Y., Grätzel, M., De Angelis, F., Sivula, K., Wirtz, T., Nazeeruddin, M. K., J. Am. Chem. Soc. 138 (2016), 15821Google Scholar
[7]Vollnhals, F., Audinot, J.-N., Wirtz, T., Mercier-Bonin, M., Fourquaux, I., Schroeppel, B., Kraushaar, U., LevRam, V., Ellisman, M. H., Eswara, S., Anal. Chem. 89 (2017), 10702-10710Google Scholar