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23 results

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  • Temperature Measurement in a TEM using Electron Diffraction of Amorphous Films
  • Misa Hayashida, Kai Cui, Marek Malac
  • Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
  • Published online by Cambridge University Press: 04 August 2017, pp. 950-951
  • Print publication: July 2017
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  • Tomographic measurement of buried interface roughness
  • Misa Hayashida, Shinichi Ogawa, Marek Malac
  • Journal: Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
  • Published online by Cambridge University Press: 23 September 2015, pp. 2243-2244
  • Print publication: August 2015
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  • Electron Diffraction-Based Quality Evaluation of Graphene Films
  • Kai Cui, Ken Bosnick, Rob Indoe, Marek Malac
  • Journal: Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
  • Published online by Cambridge University Press: 27 August 2014, pp. 1786-1787
  • Print publication: August 2014
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Page 1 of 2