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26 results

Page 1 of 2

  • High-Energy Electron Scattering in Thick Samples Evaluated by Bright-Field Transmission Electron Microscopy, Energy-Filtering Transmission Electron Microscopy, and Electron Tomography

  • Misa Hayashida, Marek Malac
  • Journal:
    Microscopy and Microanalysis / Volume 28 / Issue 3 / June 2022
    Published online by Cambridge University Press:
    28 March 2022, pp. 659-671
    Print publication:
    June 2022

  • Energy-filtering transmission electron microscopy (TEM) and bright-field TEM can be used to extract local sample thickness $t$ and to generate two-dimensional sample thickness maps. Electron tomography can be used to accurately verify the local $t$. The relations of log-ratio of zero-loss filtered energy-filtering TEM beam intensity ($I_{{\rm ZLP}}$) and unfiltered beam intensity ($I_{\rm u}$) versus sample thickness $t$ were measured for five values of collection angle in a microscope equipped with an energy filter. Furthermore, log-ratio of the incident (primary) beam intensity ($I_{\rm p}$) and the transmitted beam $I_{{\rm tr}}$ versus $t$ in bright-field TEM was measured utilizing a camera before the energy filter. The measurements were performed on a multilayer sample containing eight materials and thickness $t$ up to 800 nm. Local thickness $t$ was verified by electron tomography. The following results are reported:

    • The maximum thickness $t_{{\rm max}}$ yielding a linear relation of log-ratio, $\ln ( {I_{\rm u}}/{I_{{\rm ZLP}}})$ and $\ln ( {I_{\rm p}}/{I_{{\rm tr}}} )$, versus $t$.

    • Inelastic mean free path ($\lambda _{{\rm in}}$) for five values of collection angle.

    • Total mean free path ($\lambda _{{\rm total}}$) of electrons excluded by an angle-limiting aperture.

    • $\lambda _{{\rm in}}$ and $\lambda _{{\rm total}}$ are evaluated for the eight materials with atomic number from $\approx$10 to 79.

    The results can be utilized as a guide for upper limit of $t$ evaluation in energy-filtering TEM and bright-field TEM and for optimizing electron tomography experiments.

  • Maximum thicknesses of EELS log ratio thickness measurement for several elements

  • Misa Hayashida, Marek Malac
  • Journal:
    Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
    Published online by Cambridge University Press:
    30 July 2021, pp. 716-718
    Print publication:
    August 2021
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  • Higher-Order Structure of Human Chromosomes Observed by Electron Diffraction and Electron Tomography

  • Misa Hayashida, Rinyaporn Phengchat, Marek Malac, Ken Harada, Tetsuya Akashi, Nobuko Ohmido, Kiichi Fukui
  • Journal:
    Microscopy and Microanalysis / Volume 27 / Issue 1 / February 2021
    Published online by Cambridge University Press:
    20 November 2020, pp. 149-155
    Print publication:
    February 2021

  • It is well known that two DNA molecules are wrapped around histone octamers and folded together to form a single chromosome. However, the nucleosome fiber folding within a chromosome remains an enigma, and the higher-order structure of chromosomes also is not understood. In this study, we employed electron diffraction which provides a noninvasive analysis to characterize the internal structure of chromosomes. The results revealed the presence of structures with 100–200 nm periodic features directionally perpendicular to the chromosome axis in unlabeled isolated human chromosomes. We also visualized the 100–200 nm periodic features perpendicular to the chromosome axis in an isolated chromosome whose DNA molecules were specifically labeled with OsO4 using electron tomography in 300 keV and 1 MeV transmission electron microscopes.

  • Continuous Wavelet Transforms for Measuring Roughness of Nanoscale Interfaces

  • Darren Homeniuk, Marek Malac, Misa Hayashida
  • Journal:
    Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
    Published online by Cambridge University Press:
    01 August 2018, pp. 1048-1049
    Print publication:
    August 2018
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  • Temperature Measurement in a TEM using Electron Diffraction of Amorphous Films

  • Misa Hayashida, Kai Cui, Marek Malac
  • Journal:
    Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
    Published online by Cambridge University Press:
    04 August 2017, pp. 950-951
    Print publication:
    July 2017
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  • Tomographic measurement of buried interface roughness

  • Misa Hayashida, Shinichi Ogawa, Marek Malac
  • Journal:
    Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
    Published online by Cambridge University Press:
    23 September 2015, pp. 2243-2244
    Print publication:
    August 2015
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Page 1 of 2