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Hole Free Phase Plate Electron Tomography in Material Sciences

Published online by Cambridge University Press:  01 August 2018

Misa Hayashida
Affiliation:
Nanotechnology Research Center, Edmonton, Canada.
Amin Morteza Najarian
Affiliation:
Nanotechnology Research Center, Edmonton, Canada. Department of Chemistry, University of Alberta, Edmonton, Canada.
Richard McCreery
Affiliation:
Nanotechnology Research Center, Edmonton, Canada. Department of Chemistry, University of Alberta, Edmonton, Canada.
Marek Malac
Affiliation:
Nanotechnology Research Center, Edmonton, Canada. Department of Physics, University of Alberta, Edmonton, Canada.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

References:

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[4] Malac, M., et al, Micron 100 2017) p 10.Google Scholar
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[6] Morteza Najarian, A., et al, ACS Nano 10 2016) p 8918.Google Scholar
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[8] Hayashida, M., et al, Proceedings of the 37the Annual NANO testing symposium 2016) p 129.Google Scholar
[9] We acknowledge the help of Dr. Motoki, Dr. Konyuba, Dr. Ishikawa and Dr. Okura of JEOL Ltd.Google Scholar