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Charging of Thin Film Phase Plates under Electron Beam Irradiation

Published online by Cambridge University Press:  27 August 2014

Marek Malac ,
Marco Beleggia ,
Ray Egerton ,
Masahiro Kawasaki ,
Michael Berge ,
Yoshio Okura ,
Isamu Ishikawa  and
Kohei Motoki
Marek Malac
Affiliation:
National Institute of Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Canada Department of Physics, University of Alberta, T6G 2E1, Edmonton, Canada
Marco Beleggia
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, Denmark
Ray Egerton
Affiliation:
National Institute of Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Canada Department of Physics, University of Alberta, T6G 2E1, Edmonton, Canada
Masahiro Kawasaki
Affiliation:
JEOL Ltd. 1-2 Musashino- 3 chome, Akishima, Tokyo 198-8558, Japan
Michael Berge
Affiliation:
National Institute of Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Canada
Yoshio Okura
Affiliation:
JEOL Ltd. 1-2 Musashino- 3 chome, Akishima, Tokyo 198-8558, Japan
Isamu Ishikawa
Affiliation:
JEOL Ltd. 1-2 Musashino- 3 chome, Akishima, Tokyo 198-8558, Japan
Kohei Motoki
Affiliation:
JEOL Ltd. 1-2 Musashino- 3 chome, Akishima, Tokyo 198-8558, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 230 - 231
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Berriman, J. and Leonard, K. L. Ultramicroscopy 19 (1986), p. 349.Google Scholar
[2] Malac, M., et. al. Ultramicroscopy 118 (2012), p. 77.Google Scholar
[3] Danov, K., Danev, R. and Nagayama, K. Ultramicroscopy 87 (2000), p. 45.Google Scholar
[4] Support of ΝIΝΤ, NSERC and JEOL Ltd. is gratefully acknowledged.Google Scholar