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Hole-Free Phase Plate Energy Filtering Imaging of Graphene: Toward Quantitative Hole-Free Phase Plate Imaging in a TEM

Published online by Cambridge University Press:  04 August 2017

Marek Malac ,
Emi Kano ,
Misa Hayashida ,
Masahiro Kawasaki ,
Sohei Motoki ,
Ray Egerton ,
Isamu Ishikawa ,
Yoshio Okura  and
Marco Beleggia
Marek Malac
Affiliation:
National Institute of Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Canada. Department of Physics, University of Alberta, T6G 2E1, Edmonton, Canada.
Emi Kano
Affiliation:
National Institute of Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Canada. Department of Physics, University of Alberta, T6G 2E1, Edmonton, Canada.
Misa Hayashida
Affiliation:
National Institute of Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Canada.
Masahiro Kawasaki
Affiliation:
JEOL Ltd. 1-2 Musashino 3 chome, Akishima, Tokyo 198-8558, Japan.
Sohei Motoki
Affiliation:
JEOL Ltd. 1-2 Musashino 3 chome, Akishima, Tokyo 198-8558, Japan.
Ray Egerton
Affiliation:
Department of Physics, University of Alberta, T6G 2E1, Edmonton, Canada.
Isamu Ishikawa
Affiliation:
JEOL Ltd. 1-2 Musashino 3 chome, Akishima, Tokyo 198-8558, Japan.
Yoshio Okura
Affiliation:
JEOL Ltd. 1-2 Musashino 3 chome, Akishima, Tokyo 198-8558, Japan.
Marco Beleggia
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, 2800 Lyngby, Denmark.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 842 - 843
Copyright
© Microscopy Society of America 2017 

References

[1] Malac, M., et. al., Ultramicroscopy 118 2012). p. 77.CrossRefGoogle Scholar
[2] Egerton, R. F. EELS in the TEM, 2nd ed Springer Verlag 2011.Google ScholarPubMed
[3] Support of NINT and JEOL USA Inc. is acknowledged. The work was made possible by close collaboration with team at JEOL Ltd. Dr. Y. Okura, Dr. I. Ishikawa, Y. Konyuba and Dr. Hosogi.Google Scholar