21 results
Grain Engineering Approaches for High-Performance Polysilicon Thin-Film Transistor Fabrication
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- Journal:
- MRS Online Proceedings Library Archive / Volume 508 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 55
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- January 1998
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Formation of Sub-100 NM GE Wires on Si by E-Beam Evaporation/Lithography
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- Journal:
- MRS Online Proceedings Library Archive / Volume 380 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 105
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- 1995
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Excimer Laser Induced Crystallization of Amorphous Silicon-Germanium Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 321 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 689
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- 1993
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Dopant Distribution and Electrical Characteristics of Boron-Doped Si1−xGex/Si p+/N Heterojunction Diodes Produced by Gas Immersion Laser Doping (GILD) / Pulsed Laser-Induced Epitaxy (PLIE)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 263 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 383
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- 1992
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A Study of Interdiffusion, Crystallinity, Strain and Thermal Stability of Si1−xGex/Si Created Using Pulsed Laser Induced Epitaxy (PLIE)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 263 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 279
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- 1992
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Shallow Junction Formation in Silicon: Dopant Incorporation and Diffusion Through Tungsten Silicide Films Using Gas Immersion Laser Doping (Gild)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 260 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 673
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- 1992
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Selective Growth of Heteroepitaxial GexSi1−x/Si Lateral Wells Using Pulsed Laser Induced Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 220 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 619
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- 1991
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Characterization of Shallow Junctions Fabricated by Gas Immersion Laser Doping (Gild)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 92 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 65
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- 1987
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Hgl−xCdxTe Near Surface Characterization using Computer Aided Rutherford Backscattering Spectrometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 90 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 233
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- 1986
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UV Laser Processing of Semiconductor Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 75 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 619
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- 1986
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Optimizing the Depth Resolution of Rutherford Backscattering Through Modeling of Noise Sources
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- Journal:
- MRS Online Proceedings Library Archive / Volume 69 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 275
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- 1986
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The Effect of Implantation and Annealing Conditions on the Fe Profile in Semi-Insulating InP.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 74 / 1986
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- 28 February 2011, 731
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- 1986
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In-Situ High Resolution Transmission Electron Microscopy of Dynamic Events During the Amorphous to Crystalline Phase Transformation in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 62 / 1985
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- 25 February 2011, 311
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- 1985
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Silicon on Sapphire of Single Crystal Quality Obtained by Double Solid Phase Epitaxial Regrowth
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- MRS Online Proceedings Library Archive / Volume 37 / 1984
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- 26 February 2011, 211
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- 1984
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A Comparison of Thermal, Line-Source Electron Beam and CW Laser Annealing for the Fabrication of Ersi2 Schottky Barrier on Si.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 25 / 1983
- Published online by Cambridge University Press:
- 22 February 2011, 93
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- 1983
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Initial Phase formation at the Interface of Ni, Pd, or Pt and Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 25 / 1983
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- 22 February 2011, 9
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- 1983
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Thermal Pulse Annealing of Hg1−xCdxTe
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- Journal:
- MRS Online Proceedings Library Archive / Volume 13 / 1982
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- 15 February 2011, 671
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- 1982
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Impurity Redistribution Studies on Laser-Formed Silicides
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- Journal:
- MRS Online Proceedings Library Archive / Volume 13 / 1982
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- 15 February 2011, 721
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- 1982
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Pulsed X-Ray Annealing of Arsenic-Implanted Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 4 / 1981
- Published online by Cambridge University Press:
- 15 February 2011, 281
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- 1981
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Raman Spectroscopic Evaluation of Silicides Formed with A Scanned Electron Beam
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1 / 1980
- Published online by Cambridge University Press:
- 15 February 2011, 541
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- 1980
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