17 results
The relationship of family characteristics and bipolar disorder using causal-pie models
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- Journal:
- European Psychiatry / Volume 29 / Issue 1 / January 2014
- Published online by Cambridge University Press:
- 15 April 2020, pp. 36-43
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Isogeometric Analysis of the Dual Boundary Element Method for the Laplace Problem With a Degenerate Boundary
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- Journal of Mechanics / Volume 36 / Issue 1 / February 2020
- Published online by Cambridge University Press:
- 23 September 2019, pp. 35-46
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- February 2020
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Revisit of the Dual Bem using SVD Updating Technique
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- Journal of Mechanics / Volume 31 / Issue 5 / October 2015
- Published online by Cambridge University Press:
- 10 April 2015, pp. 505-514
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- October 2015
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Effects of Structural Behavior on Electromagnetic Resonance Frequency of a Superconducting Radio Frequency Cavity
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- Journal of Mechanics / Volume 23 / Issue 3 / September 2007
- Published online by Cambridge University Press:
- 05 May 2011, pp. 187-196
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- September 2007
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Reduction of dark current in AlGaN/GaN Schottky barrier photodetectors with a low-temperature-grown GaN cap layer
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- Journal:
- MRS Online Proceedings Library Archive / Volume 798 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Y10.11
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- 2003
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Concentration and Stress Evolution During Electromigration in Passivated Al(0.25 at. % Cu) Conductor Lines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 612 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D1.8.1
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- 2000
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X-Ray Microbeam Studies of Electromigration
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- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 153
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- 1999
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In-Situ X-Ray Microbeam Cu Fluorescence and Strain Measurements on Al(0.5 AT.% Cu) Conductor Lines During Electromigration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 163
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- 1999
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Semiconductor Superlattices Studied by Grazing X-ray Scattering and Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 417 / 1995
- Published online by Cambridge University Press:
- 10 February 2011, 325
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- 1995
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Closed-Loop Thickness Control of Resonant-Tunneling Diode Mbe Growth Using Spectroscopic Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 406 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 365
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- 1995
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X-Ray Scattering Studies of Interfacial Microstructures in Inx, Ga1−x As/GaAs Superlattices
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- MRS Online Proceedings Library Archive / Volume 375 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 171
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- 1994
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Variations of Interfacial Roughness with Epilayer Thickness and Scaling Behavior in Si1−x,Gex, Grown on Si(100) Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 367 / 1994
- Published online by Cambridge University Press:
- 03 September 2012, 311
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- 1994
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X-Ray Grazing Angle Scattering and Fluorescence Studies of Interfacial Microstructures in Si1-xGex/Si Multilayers
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- MRS Online Proceedings Library Archive / Volume 280 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 261
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- 1992
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Materials and Device Characteristics of InAlAs/InGaAs HEMTs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 281 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 251
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- 1992
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Properties of SiO2 Films Fabricated by Microwave ECR Plasma Processing with and without Energetic Particle Bombardment During Film Deposition. Part II: Electronic Properties
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- MRS Online Proceedings Library Archive / Volume 225 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 277
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- 1991
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Properties of SiO2 Films Fabricated by Microwave Ecr Plasma Processing with and Without Energetic Particle Bombardment During Film Deposition Part I. Fabrication Processes and Physical Properties
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- MRS Online Proceedings Library Archive / Volume 223 / 1991
- Published online by Cambridge University Press:
- 16 February 2011, 69
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- 1991
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MBE Growth of GaAs on Porous Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 91 / 1987
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- 28 February 2011, 113
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- 1987
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