12 results
Advances in Elemental Electron Tomography for the State-of-the-art Semiconductor Devices and Circuits Characterization and Failure Analysis
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1456-1457
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- July 2017
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How to Avoid Artifacts in Nanobeam Diffraction Strain Measurements
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1420-1421
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- July 2017
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The Influence of Beam Convergence Angle on Channeling Effect during STEM/EDS Quantification of SiGe Concentration
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 1618-1619
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- July 2016
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The Combination of STEM Tomography and STEM/EDS Analysis of NiSi Formation Related Defects in Semiconductor Wafer-foundries
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 326-327
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- July 2016
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Electron Holography of CMOS Devices with Epitaxial Layers
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 252-253
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- August 2014
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Electron Holography with Variable Magnification for Semiconductor Device Characterization
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 564-565
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- August 2005
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Variable Magnification Electron Holography for 2-D Mapping of Semiconductor Devices
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- Microscopy Today / Volume 12 / Issue 6 / November 2004
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- 14 March 2018, pp. 20-25
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- November 2004
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A Comparison of Grain Size Measurements in Al-Cu Thin Films: Imaging Vs. Diffraction Techniques
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- Microscopy Today / Volume 10 / Issue 6 / November 2002
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- 14 March 2018, pp. 5-9
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- November 2002
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A Comparison of Grain Size Measurements in Al-Cu Thin Films: Imaging verses Diffraction Techniques
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 672-673
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- August 2002
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Low Temperature Formation of C54 TiSi2 Bypassing the C49 Phase: Effect of Si Crystallinity, Metallic Impurities and Applications TO 0.10 μm CMOS
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- MRS Online Proceedings Library Archive / Volume 514 / 1998
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- 10 February 2011, 201
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- 1998
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Effect of Mo Doping on Formation of Ti-Silicide Phases Studied by HRTEM
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- MRS Online Proceedings Library Archive / Volume 523 / 1998
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- 10 February 2011, 91
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- 1998
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Low Temperature Chemical Vapor Deposition of Titanium Dioxide Thin Films Using Tetranitratotitanium (IV)
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- MRS Online Proceedings Library Archive / Volume 495 / 1997
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- 10 February 2011, 45
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- 1997
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