29 results
Subaru/HSC identifications of protocluster candidates at z ∼ 6–7: Implications for cosmic reionization
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- Journal:
- Proceedings of the International Astronomical Union / Volume 15 / Issue S341 / November 2019
- Published online by Cambridge University Press:
- 10 June 2020, pp. 231-234
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- November 2019
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Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 32-33
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- July 2016
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The Development of A Large-Area Windowless Energy Dispersive X-ray Detector for STEM-EDX Analysis
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1192-1193
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- August 2013
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Simultaneous Imaging of Surface and Bulk at Atomic Resolution
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 306-307
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- July 2012
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Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 388-389
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- July 2012
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Reduce the electron damage in atomic resolved SEM observation using aberration corrected electron microscope.
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 374-375
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- July 2012
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Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1298-1299
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- July 2011
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High-resolution SEM Imaging with Aberration Correction for Highly Precise Measurement of Semiconductors
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 09 April 2017, pp. 930-931
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- July 2011
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Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 610-611
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- July 2010
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High-Resolution Secondary Electron Imaging of a FIB Prepared Si Sample with an Aberration Corrected Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 128-129
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- July 2010
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High Resolution Secondary-Electron and ADF-STEM Imaging with Hitachi HD2700C Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 102-103
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- July 2010
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Atomic Structure and 3D Shapes of FePd Nanoparticles Observed by HRTEM, HAADF-STEM and Electron Tomography
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1648-1649
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- July 2010
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Naturally-Formed Nanoscale Phase Separation in Epitaxially-Grown III-V Semiconductor Alloys
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1470-1471
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- July 2010
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Minimizing 6-fold Symmetry and Chromatic Aberration by Using Ultra High Resolution Lens in Cs-Corrected STEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 136-137
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- July 2010
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Application of Low Accelerating Voltage Aberration Corrected Dedicated STEM With Cold FEG.
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 4-5
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- July 2009
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Characterization of L10-Type FePd Alloy Nanoparticles by Atomic-Resolution HAADF-STEM and Electron Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1262-1263
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- July 2009
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Flat rotation curves in Chern-Simons modified gravity
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- European Astronomical Society Publications Series / Volume 36 / 2009
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- 30 May 2009, pp. 99-100
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- 2009
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Uranium Single Atom Imaging And EELS Mapping using Aberration Corrected Scanning Transmission Electron Microscope and LN2 Cold Stage
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1386-1387
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- August 2008
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The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1374-1375
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- August 2008
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3D Elemental Mapping Using a Dedicated STEM Equipped with a Real-Time EELS Imaging System
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1404-1405
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- August 2008
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