19 results
Bayesian Statistical Model for Imaging of Single La Vacancies in LaMnO3
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1572-1573
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- July 2017
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Three-Dimensional Imaging of Single La Vacancies in LaMnO3
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 902-903
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- July 2016
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High-precision stress mapping and defect characterization of thin films of LaMnO3grown on DyScO3substrate.
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1526-1527
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- July 2016
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Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 1887-1888
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- August 2015
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Increased Fluctuation of Interatomic Distances in Distorted Structure of Stoichiometric LaMnO3
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 2413-2414
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- August 2015
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Thickness Variations and Absence of Lateral Compositional Fluctuations in Aberration-Corrected STEM Images of InGaN LED Active Regions at Low Dose
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- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
- Published online by Cambridge University Press:
- 26 March 2014, pp. 864-868
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- June 2014
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Structural and Elemental Analysis of Heavily- Doped ZnO
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 392-393
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- July 2012
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Absence of Lateral Composition Fluctuations in Aberration-corrected STEM Images of an InGaN Quantum Well at Low Dose
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- MRS Online Proceedings Library Archive / Volume 1432 / 2012
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- 16 May 2012, mrss12-1432-g04-03
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- 2012
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Indium Composition Variation in Nominally Uniform InGaN Layers Discovered by Aberration-Corrected Z-contrast STEM
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1386-1387
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- July 2011
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Effect of Growth Conditions on Electronic and Structural Properties of GZO Films Grown by Plasma-enhanced Molecular Beam Epitaxy on p-GaN(0001)/Sapphire Templates
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- MRS Online Proceedings Library Archive / Volume 1315 / 2011
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- 04 April 2011, mrsf10-1315-mm09-03
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- 2011
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Transmission Electron Miscroscopy Study of the Fused Silicon/Diamond Interface
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- MRS Online Proceedings Library Archive / Volume 768 / 2003
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- 02 August 2011, G2.9
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- 2003
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HRTEM Studies of Morphological and Interfacial Changes of Nanodiamond in Field Emission Experiments
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 November 2002, pp. 1110-1111
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- August 2002
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Improved magnetic properties of self-assembled epitaxial nickel nanocrystallites in thin-film ceramic matrix
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- Journal of Materials Research / Volume 17 / Issue 4 / April 2002
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- 31 January 2011, pp. 738-742
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- April 2002
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SiC TO SiC WAFER BONDING
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- MRS Online Proceedings Library Archive / Volume 742 / 2002
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- 11 February 2011, K2.5
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- 2002
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Manipulation of Nanodiamond Clusters for Nanoscale Applications
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 390-391
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- August 2001
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Diffusion Characteristics of Cu in TiN Thin Films
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- MRS Online Proceedings Library Archive / Volume 686 / 2001
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- 15 March 2011, A9.8
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- 2001
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Wafer Bonding of Diamond Films to Silicon for Silicon-on-Insulator Technology
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- MRS Online Proceedings Library Archive / Volume 686 / 2001
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- 15 March 2011, A2.6
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- 2001
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Growth, Characterization and Electrical Properties of PZT thin Film Heterostructures on Silicon by Pulsed Laser Deposition
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- MRS Online Proceedings Library Archive / Volume 623 / 2000
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- 10 February 2011, 143
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- 2000
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Effect of Interface-Related Deep Levels on high Sensitivity of Schottky Diode Photodetector Based on Ultrathin InGaAs Film on Si
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- MRS Online Proceedings Library Archive / Volume 533 / 1998
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- 10 February 2011, 157
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- 1998
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