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Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

Jie Feng ,
Alexander V. Kvit ,
Andrew B. Yankovich ,
Chenyu Zhang ,
Dane Morgan  and
Paul M. Voyles
Jie Feng
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA
Alexander V. Kvit
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Andrew B. Yankovich
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Chenyu Zhang
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Dane Morgan
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Paul M. Voyles
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1887 - 1888
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Yankovich, A. B., et al., Nat. Commun. 5 (2014). p 4155.CrossRefGoogle Scholar
[2] Kirkland, E.J. in Advanced Computing in Electron Microscopy, 1st Edition, Springer, 1998.CrossRefGoogle Scholar
[3] Voyles, P. M., et al., Ultramicroscopy. 96 (2003). p 251.Google Scholar
[4] This work was supported by the US Department of Energy, Basic Energy Sciences, Grant DE-FG02-08ER46547..Google Scholar