6745 results in Powder Diffraction & past titles
The in-Situ Observation of Organic Thin Films During Growth Process by Using Grazing Incidence X-Ray Diffraction and Fluorescence Methods
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 653-658
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- 1995
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Residual Stress in Si3N4-Passivated GaAs Wafers
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 237-241
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- 1995
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New Tools for Grazing Incidence Diffraction Measurements: Comparison of Different Primary and Secondary Beam Conditioners
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 87-94
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- 1995
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Inhomogeneous Deformation in Thin Films
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 627-635
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- 1995
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X-Ray Fractography on Fatigue Fracture Surfaces of Mg-9mass%Al-1mass%Zn Alloy
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 491-498
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- 1995
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Separation of Txrf Peaks and Background Using a Spreadsheet
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 791-797
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- 1995
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Elastic Anisotrophy and Residual Stress in Textured Production Electrolytic Chromium Coatings on Steel
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 257-266
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- 1995
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Peritectic Melting Sequence of Bi-2212 and Bi-2212/Ag Measured Using Insitu XRD
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 723-729
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- 1995
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Peak Broadening in Asymmetric X-Ray Diffraction Resulting from Chi Tilts
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 499-503
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- 1995
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Recent Developments in Txrf of Light Elements
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 771-779
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- 1995
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Neutron and X-Ray Scattering Studies of the Metallurgical Condition and Residual Stresses in Weldalite Welds
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 297-303
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- 1995
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The Study of the Electronic Structure of ZnS Doped With Co by Electron Microprobe
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 831-835
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- 1995
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The Excitation of Low Z Elements by Means of a Cylindrical Graded Multilayer as a High Energy Cut-Off in Edxrf Analysis
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 119-126
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- 1995
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Application of Graded Multilayer Optics in X-Ray Diffraction
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 57-71
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- 1995
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Metal Film Thickness Standards
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 707-712
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- 1995
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Novel GIX2 Apparatus for Thin Film Analysis Using Color Laue Method
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 171-180
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- 1995
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Txrf-Sources-Samples and Detectors
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 755-766
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- 1995
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Multi-Capillary and Conic Optical Elements for Parallel Beam Production
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 73-79
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- 1995
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Analysis of Thin Films and Multi-Layer Thin Films containing Light Elements by XRF
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 701-706
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- 1995
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PDX volume 39 Cover and Front matter
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, p. f1
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- 1995
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