6745 results in Powder Diffraction & past titles
Synchrotron X-ray Microbeam Characteristics for X-ray Fluorescence Analysis
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 283-289
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- 1994
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In-Situ Study of Dynamic Structural Rearrangements During Stress Relaxation
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 243-254
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- 1994
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Development of Bone-Lead Reference Materials for Validating In Vivo Xrf Measurements
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 625-632
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- 1994
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The Impact of Background Function on High Accuracy Quantitative Rietveld Analysis (QRA): Application to NIST SRMs 676 and 656
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 59-68
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- 1994
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Separation of Internal Strains and Lattice Distortion Caused by Oxygen Impurities in Aluminum Nitride Hot-Pressed Ceramics
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 479-487
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- 1994
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Fluorine Implantation and Residual Stresses in Polysilicon Films
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 235-242
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- 1994
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Design of an X-Ray Fluorescence Sensor for the Cone Penetrometer
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 699-704
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- 1994
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Subject Index
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 22 October 2019, p. 779
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- 1994
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Trace Analysis by TXRF
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 687-690
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- 1994
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Application of Line Modified-Asymmetric Crystal Topography for Qualitative and Quantitative Evaluation of Integrated Circuits
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 227-234
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- 1994
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In Vivo X-Ray Fluorescence of Lead and Other Toxic Trace Elements
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 563-572
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- 1994
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Accuracy in Quantitative X-ray Powder Diffraction Analyses
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 47-57
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- 1994
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Accurate Measurement of Trace Elements Using an Innovative Fixed Goniometer for a Simultaneous Spectrometer
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 691-698
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- 1994
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Picosecond X-ray Diffraction: System and Applications
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 21-33
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- 1994
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A New Approach in Performing Microdiffraction Analysis
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 551-556
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- 1994
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Appllied Crystallography in the Scanning Electron Microscope Using a CCD Detector*
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 539-545
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- 1994
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X-ray Fractographic Study on TiAl Alloys with Various Types of Microstructures
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 427-434
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- 1994
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Total Electron Yield (TEY) A New Approach for Quantitative X-ray Analysis
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 325-335
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- 1994
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Detection and Modelling of Micro-Crystallinity by Means of X-ray Powder Diffractometry
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 405-412
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- 1994
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Manufacture and Use of Setting up Samples
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 337-351
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- 1994
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