ICDD’s quarterly, (and a special topical issue) international journal, Powder Diffraction, focuses on materials characterization employing X-ray powder diffraction and related techniques. With feature articles covering a wide range of applications, from mineral analysis to epitactic growth of thin films to advances in application software and hardware, this journal offers a wide range of practical applications. ICDD, in collaboration with the Denver X-ray Conference Organizing Committee, has increased services for the subscribers of Powder Diffraction and authors of Advances in X-ray Analysis. Beginning in 2006, ICDD offered a copy of the previous year’s edition of AXA to Powder Diffraction institutional subscribers who receive both print and on-line versions. This effectively doubles the number of articles annually available to Powder Diffraction subscribers and significantly increases the circulation for the authors in Advances in X-ray Analysis. Subject coverage includes: • Techniques and procedures in X-ray powder diffractometry • Advances in instrumentation • Study of materials including organic materials, minerals, metals and thin film superconductors • Publication of powder data on new materials Authors, subjects and page numbers are listed in the past issue content pages
. Authors should read Notes for Authors
for information on the scope, categories, manuscript preparation and submission to Powder Diffraction.