6745 results in Powder Diffraction & past titles
Residual Stress and Microstructural Characterization Using Rietveld Refinement of a Carburized Layer in a 5120 Steel
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 319-329
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- 1995
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X-Ray Determination of Stresses Distribution in a Coarse Grained Silicon Billet
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 225-235
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- 1995
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Comparison of Various Descriptions of X-Ray Tube Spectra
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 127-135
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- 1995
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Evolution of X-Ray Instrumentation & Techniques, 1970-1990
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 13-18
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- 1995
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Accurate Measurement of Lattice Misfit Between γ And γ' Phases in Nickel-Base Superalloys at High Temperatures
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 449-456
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- 1995
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High Resolution X-ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs Mqw Structures
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 439-448
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- 1995
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Software for Comparative Analysis of Diffraction-Line Broadening
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 457-464
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- 1995
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Depth profiling by Xrf with Variable Beam Geometry Applied to Thin Films in the Nanometer Region
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 675-682
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- 1995
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Pair-Density Function of Nano-Scale Morphology in Oriented Polymer Fibers: Application to Nomex Aramid
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 523-533
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- 1995
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Electronic Spreadsheets for XRF - Survey and Comparison
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 805-813
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- 1995
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An Analysis of Macro- and Microstresses Around a Fatigue Crack Tip
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 353-361
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- 1995
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Controlled-Humidity XRD Analyses: Application to the Study of Smectite Expansion/Contraction
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 713-722
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- 1995
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Internal Stress in an Alumina/Silicon Carbide Whisker Composite
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 391-403
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- 1995
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Characterization Of Single Crystal Epitaxial Aluminum Nitride Thin Films On Sapphire, Silicon Carbide And Silicon Substrates By X-Ray Double Crystal Diffractometry And Transmission Electron Microscopy
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 645-651
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- 1995
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Residual Stress of Aluminum Thin Films Sputtered on Silicon Wafers Measured by X-Ray Diffraction
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 267-279
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- 1995
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Energy Dispersive Measurement of X-Ray Tube Spectra
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 137-147
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- 1995
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X-Ray Residual Stress Measurement of Ground Tungsten Carbides with Various Cobalt Contents
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 311-318
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- 1995
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100 Years of Progress in X-Ray Fluorescence Analysis
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 29-39
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- 1995
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The Evolution of X-Ray Instrumentation at Rich. Seifert & Co.
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 47-56
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- 1995
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Visualization of Errors in Residual Stresses
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 305-310
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- 1995
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