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Software for Comparative Analysis of Diffraction-Line Broadening

Published online by Cambridge University Press:  06 March 2019

Davor Balzar
Affiliation:
Materials Science and Engineering Laboratory National Institute of Standards and Technology 325 Broadway, Bowlder, Colorado 80303, U.S.A.
Hassel Ledbetter
Affiliation:
Materials Science and Engineering Laboratory National Institute of Standards and Technology 325 Broadway, Bowlder, Colorado 80303, U.S.A.
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Abstract

Program “Breadth” was written for analyzing diffraction-line broadening. The physically broadened line profiles are required as input. The results are calculated according to three ”simplified” integral-breadth methods: Cauchy-Cauchy, Cauchy-Gauss, and Gauss-Gauss. The program output includes volume-weighted coherent domain size and a maximum strain. Furthermore, the root-mean-square strain and both surface-weighted and volume-weighted domain sizes are calculated according to the “double-Voigt” method. This method also allows the accurate determination of both surface-weighted and volume-weighted domain-size distribution functions for specimens showing a dominant size-broadening effect, which gives more detailed information than the mere average value of coherent-domain size. Some examples for ball-milled W (shows simultaneous size-strain broadening) and NiFe2O4 (shows pronounced pure-size broadening) are included.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1995

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