Microscopy and Microanalysis: Volume 26 -

Only show content I have access to (1258)

Only show open access (21)

Over 3 years (1367)

Biological Applications (25)

Plenary Session (2)

Author Index (1)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 26 - December 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

Innovative Grounding Methodology for Epoxy Impregnated Semiconductor Cross Sections for Electron Microscopy Inspection

Observation of Rectifying and Ohmic Grain Boundaries in Polycrystalline BaTiO3 Capacitors with STEM EBIC

Nanoscale Investigation of Layered Oxychloride Intergrowth Photocatalysts for Visible Light Driven Water Splitting

From Photons to Electrons - A Correlative Workflow for Analysis and Preparation of Embedded Samples Using the LaserFIB

Comparison of Cathodoluminescent Emission from Scheelite and Wolframite Structured Electrospun Tungstate Nanofibers

From Magnetite Nanoparticles to Thin Film and Nano-lithographed Arrays

Development of the Fabrication of Graphene Liquid Cells for Transmission Electron Microscopy

Characterization by Scanning Electron Microscopy on Drill Boride and Drilling Performance of Tool Steels

Selective Detection of Secondary Electrons in an SEM using a Multi-Channel Detector

Advanced Characterization of Nuclear Fuels and Materials

Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study

Mesoscale Thermal Transport Measurements of Multi-phase and Porous Nuclear Fuels Using a Square-wave Pulse Thermoreflectance Technique

FIB-SEM for Nano-CT of Tritiated LiAlO2 Pellet Nanopores

Advanced Characterization of Phase Stability Under Ion Irradiation of Utrafine-grained and Nanocrystalline SS304L

SEM and EBSD Characterization of Cold-Sprayed Chromium Coatings on Zircaloy-4

AlCoCrFeNi High Entropy Alloys as Possible Nuclear Materials

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

SIMS Detector on FIB/SEM DualBeam Microscopes for Material Science Applications

Development of the Ruthenium Marking System for Local Defect Observation of Zeolite Membrane

A New Generation Plasma FIB Column with Higher Probe Current and Improved Imaging Resolution

O+ PFIB Milling and Measurement of FIB Damage in Silicon

Operando Investigation of Energy Storage Material by FIB-SEM System

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 26 - December 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

Advanced Characterization of Nuclear Fuels and Materials

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering