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Development of the Ruthenium Marking System for Local Defect Observation of Zeolite Membrane

Published online by Cambridge University Press:  30 July 2020

Kouhei Takatani ,
Kiyofumi mori ,
Takashi Okabe  and
Hajime Matsumoto
Kouhei Takatani
Affiliation:
Mitsubishi Chemical Corporation, Yokohama, Kanagawa, Japan
Kiyofumi mori
Affiliation:
Mitsubishi Chemical Corporation, Yokohama, Kanagawa, Japan
Takashi Okabe
Affiliation:
Mitsubishi Chemical Corporation, Yokohama, Kanagawa, Japan
Hajime Matsumoto
Affiliation:
Mitsubishi Chemical Corporation, Yokohama, Kanagawa, Japan

Abstract

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Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 410 - 411
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Copyright
Copyright © Microscopy Society of America 2020

References

Funke, H. H. et al. , Journal of Membrane Science 409–410, 212–221. (2012).10.1016/j.memsci.2012.03.058CrossRefGoogle Scholar