Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Measuring the Mean Inner Potential Of Al2O3 Sapphire Using Off-axis Electron Holography

Post-fatigue Investigation of SLM Ti64 Scaffolds by 3D Correlative Tomography

Corrected Off-axis Diffraction Holograms for Electrons

Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes

Ultrafast Imaging the Evanescent Electromagnetic Field of Nanostructures by UEM

Development of RF-compressed High-throughput Femtosecond Electron Microscope

Novel UEM Setup for Improved Resolution and Extended Experimental Capabilities

Periodic Lensing from a Photoemitted Electron Gas Undergoing Cyclotron Oscillations

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't

Multislice Simulations with Plasmon Energy Losses

abTEM: ab Initio Transmission Electron Microscopy Image Simulation

Measuring Interatomic Bonding and Charge Redistributions in Defects by Combining 4D-STEM and STEM Multislice Simulations

Improving the Speed and Accuracy of Large-scale Scanning Transmission Electron Microscopy (STEM) Electron Scattering Simulations

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

What Do You Get If You Cross a Phase Object Approximation with a Dynamically Scattering Sample?

Phase Contrast Imaging in Thick, Heterogeneous Samples via S-Matrix Phase Retrieval and Depth Sectioning

Multiscale Electric Field Imaging of Vortices in PbTiO3-SrTiO3 Superlattice

Focused-probe STEM Ptychography: Developments and Opportunities

Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences

Low-loss Electron Energy-loss Spectroscopy in 2-D Materials and Liquids

Revisiting EELS Fine Structure Analysis for Polymers

In Situ Observations of Post-Synthesis Modification of a Metal-Organic Framework Using Atomic Resolution S/TEM and EELS

Advances and Applications of EELS in Biology

Microscopy and Microanalysis

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Volume 26 - December 2020

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences