Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-26T09:41:21.831Z Has data issue: false hasContentIssue false
  • English
  • Français

Development of RF-compressed High-throughput Femtosecond Electron Microscope

Published online by Cambridge University Press:  30 July 2020

Shuaishuai Sun ,
Xiaoyi Sun ,
Joseph Williams  and
Chong-Yu Ruan
Shuaishuai Sun
Affiliation:
Michigan State University, East Lansing, Michigan, United States
Xiaoyi Sun
Affiliation:
Michigan State University, East Lansing, Michigan, United States
Joseph Williams
Affiliation:
Michigan State University, East Lansing, Michigan, United States
Chong-Yu Ruan
Affiliation:
Michigan State University, East Lansing, Michigan, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 430 - 433
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Miller, R. J. D., Science 343, 1108 (2014).10.1126/science.1248488CrossRefGoogle Scholar
Zewail, A. H., Science 328, 187 (2010).10.1126/science.1166135CrossRefGoogle Scholar
Konstantinova, T., Wu, L., Abeykoon, M., et al. , Phys. Rev. B 99, 180102(R) (2019).10.1103/PhysRevB.99.180102CrossRefGoogle Scholar
van Oudheusden, T., Pasmans, P. L. E. M., van der Geer, S. B., et al. , Phys. Rev. Lett. 105, 264801 (2010).10.1103/PhysRevLett.105.264801CrossRefGoogle Scholar
Williams, J., Zhou, F., Sun, T., et al. , Struct. Dyn. 4, 044035 (2017).10.1063/1.4999456CrossRefGoogle Scholar
Zhou, F., Williams, J., and Ruan, C.-Y., Chem. Phys. Lett. 683, 488 (2017).10.1016/j.cplett.2017.03.019CrossRefGoogle Scholar
Tao, Z., Han, T.-R. T., Mahanti, S. D., et al. , Phys. Rev. Lett. 109, 166406 (2012).10.1103/PhysRevLett.109.166406CrossRefGoogle Scholar
Goerlitzer, E. S. A., Speichermann, L. E., Mirza, T. A., et al. , Nanoscale Adv. 2, 394 (2020)10.1039/C9NA00757ACrossRefGoogle Scholar