Physical Science Symposia
Microscopy for Thin Films of Metals, Semiconductors and Insulators
Abstract
In situAtomic-Scale Visualization of CuO Nanowire Growth
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1588-1589
-
- Article
-
- You have access
- Export citation
3D Reconstruction and Separation of Nickel and Zirconia Based Phases from Solid Oxide Fuel Cell Anode Using Backscatter Electron Imaging
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1590-1591
-
- Article
-
- You have access
- Export citation
Annular Bright Field STEM Investigation of the (0001) Stacking Fault in Alumina
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1592-1593
-
- Article
-
- You have access
- Export citation
The Effects of Seeding Strategies on Morphology of Electroless Deposited Pd Thin Film
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1594-1595
-
- Article
-
- You have access
- Export citation
Size Effect on Spontaneous Flux-closure Domains in BiFeO3Thin Films
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1596-1597
-
- Article
-
- You have access
- Export citation
Characterizing Epitaxial Growth of Nd2Ir2O7Pyrochlore Thin Films via HAADF-STEM Imaging and EDX
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1598-1599
-
- Article
-
- You have access
- Export citation
TEM studies of TiO2-based passivated contacts in c-Si solar cells
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1600-1601
-
- Article
-
- You have access
- Export citation
S/TEM Investigation of the Structure of (Bi,Sb)2Te3/h-BN Heterostructures Grown by Molecular Beam Epitaxy
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1602-1603
-
- Article
-
- You have access
- Export citation
Influence of Laser-Pulse Energy on Field Evaporation of LaAlO3in Atom Probe Tomography Analysis
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1604-1605
-
- Article
-
- You have access
- Export citation
Fast identification of dislocations in semiconductor materials by electron channeling contrast imaging using a scanning electron microscope
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1606-1607
-
- Article
-
- You have access
- Export citation
Direct Observation of Conducting Path with Highly Reduced Graphene Oxide in Au/GO/Al Resistive Switching Memory
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1608-1609
-
- Article
-
- You have access
- Export citation
Crystallite Size Evaluation of ZnO Nanoparticles via Transmission Electron Microscopy and X-ray Powder Diffraction
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1610-1611
-
- Article
-
- You have access
- Export citation
Atomic Arrangement of Contamination on Graphene
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1612-1613
-
- Article
-
- You have access
- Export citation
Refined Phase Imaging by Electron Diffractive Imaging
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1614-1615
-
- Article
-
- You have access
- Export citation
Atomic Structure of Self-Pillared, Single-Unit-Cell Sn-MFI Zeolite Nanosheets
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1616-1617
-
- Article
-
- You have access
- Export citation
The Influence of Beam Convergence Angle on Channeling Effect during STEM/EDS Quantification of SiGe Concentration
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1618-1619
-
- Article
-
- You have access
- Export citation
The Growth of Catalyst-free NiO Nanowires
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1620-1621
-
- Article
-
- You have access
- Export citation
Utilization of Scanning Electron Microscopy to Optimize Electroless Deposition of Pd Thin Film on Porous Stainless Steel
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1622-1623
-
- Article
-
- You have access
- Export citation
Advanced TEM characterization of new electrical contacts for high efficiency c-Si solar cells
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1624-1625
-
- Article
-
- You have access
- Export citation
Atomic-scale characterization of the oxygen vacancy ordering in La0.5Sr0.5CoO3thin film grown on SrTiO3using in-situ cooling experiments
-
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1626-1627
-
- Article
-
- You have access
- Export citation