Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Nuclear and Irradiated Materials

Abstract

Cation-Dependent Hierarchical Assembly of U60 Nanoclusters into Blackberries Imaged via Cryogenic Transmission Electron Microscopy

Complementary Techniques for Quantification of α' Phase Precipitation in Neutron-Irradiated Fe-Cr-Al Model Alloys

In-Situ TEM Self-Ion Irradiation and Thermal Aging of Optimized Zirlo

In-Situ TEM Investigation of Interactions between Irradiation Defects and Crystal Defects in Austenitic Stainless Steels

TEM Identification of Phases in Metallic Pu-based Fuels

In situTEM Mechanical Testing: An Emerging Approach for Characterization of Polycrystalline, Irradiated Alloys

Measuring Interfacial Shear Strength of CuxNi-Nb Alloys

Heavy Ion Irradiation-induced Microstructural Evolution in the Next Generation Nuclear Material – Alloy 800H

Microstructural Evolution of High-Strain-Rate Severe Plastic Deformation Processed 316L during Kr Ion Irradiation and elevated Temperature Exposures

Defects Generation and Surface Evolution of ZnO Nanobelts/Nanowires Under High-energy Electron Beam Irradiation

Electron Beam-Irradiation-Induced Annealing of Nanoscale Defects Created by Heavy Ion Beam Bombardment of Indium Phosphide

Fission Product Distribution in Irradiated TRISO Fuel

Irradiation Induced Defects in YBa2Cu3O7-δCoated Conductors

Electron probe microanalysis of a high burnup (Th,Pu)O2fuel section

Multi-scale Characterization of Oxidized Zirconium Alloys

Anomalous Beam Effects during in situ Transmission Electron Microscopy Deformation of Nanocrystalline and Ultrafine-grained Metals

Grain Boundary Precipitation in Ni Based Superalloy 690 Investigated via Site-specific Atom Probe Microscopy

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract

Quantification of Atomic Arrangements at Heterostructure Interfaces

Growth andIn SituCharacterization of Oxide Epitaxial Heterostructures with Atomic Plane Precision

Observing Misfit Dislocation Interactions Across Thin Film Oxide Heterostructures

Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Nuclear and Irradiated Materials

Abstract

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract