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Observing Misfit Dislocation Interactions Across Thin Film Oxide Heterostructures

Published online by Cambridge University Press:  25 July 2016

Everett D. Grimley ,
Edward Sachet ,
Brian F. Donovan ,
Patrick E. Hopkins ,
Jon-Paul Maria  and
James M. LeBeau
Everett D. Grimley
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, USA
Edward Sachet
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, USA
Brian F. Donovan
Affiliation:
Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, USA
Patrick E. Hopkins
Affiliation:
Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, USA
Jon-Paul Maria
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, USA
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1506 - 1507
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Sachet, E, et al, Nature Materials 14 (2015). p 414.Google Scholar
[2] Sang, X & LeBeau, JM Ultramicroscopy 138 (2014). p 28.Google Scholar
[3] FRWRtools plugin for Digital Micrograph by Christoph T. Koch (Humboldt-Universität zu Berlin).Google Scholar
[4] The authors greatly acknowledge funding from the National Science Foundation through a Career Award (DMR 1350273) and through the National Science Foundation Graduate Research Fellowship Program (DGE 1252376). The authors acknowledge use of Analytical Instrumentation Facility at North Carolina State University, which is supported by the State of North Carolina and by the National Science Foundation.Google Scholar