Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract

Spectroscopic Investigations of the Structure of Graphitic Carbon Nitrides for H2 Storage

Supersonic Nanoparticle Interaction with Suspended CVD Graphene

Magnetic Materials, Phenomena and Imaging at the Nanoscale

Abstract

Recent Advances and Future Opportunities with Magnetic Soft X-ray Microscopy

Quantifying Magnetism on the nm Scale: EMCD on Individual FePt Nanoparticles

Mapping Magnetic Ordering With Aberrated Electron Probes in STEM

Periodic Magnetization Pattern for Controlled Domain Wall Motion in Nanowires

Domain behavior in functional materials studied using Lorentz microscopy

Formation of Magnetic Textures in the Ferromagnetic Phase of Lao.825Sro.i75MnO3

Investigation of Layer Composition and Morphology in Perpendicular Magnetic Tunnel Junctions

Iterative Reconstruction of the Magnetization and Charge Density using Vector Field Electron Tomography

Ferromagnetic Resonance Force Microscopy: Spectroscopy on the Nano-Scale

Three-dimensional Induction Mapping of Magnetic Nanoscale Materials by Electron Holographic Tomography

Visualization of Magnetization in CoFe Nanofibers by Lorentz TEM and Electron Holography

Controlled Magnetization by Electron Holography of Polycrystalline Cobalt Nanowires

A TEM Structural Study of the Origin of Perpendicular Magnetic Anisotropy in Ultra-thin CoFeB Film

Nonstoichiometric Twin Defects in Fe3O4(111) Thin Films: Atomic and Electronic Structure

TEM Study of the Cobalt-Rich Hf-Co Intermetallic Compounds

Development of Pulse Magnetization System on Aberration Corrected 1.2-MV Cold Field-Emission Transmission Electron Microscope

Unitary Detector DPC Imaging with Multiscale Capabilities for Analysis of Local Magnetic Field of Nanomaterials.

Extended Foucault Method for External Magnetic Fields with Conventional TEM

Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract

Magnetic Materials, Phenomena and Imaging at the Nanoscale

Abstract