Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Abstract

Evaluation of Neon Focused Ion Beam Milling for TEM Sample Preparation

Femtosecond Laser Damage in Metals and Semiconductors During TriBeam Tomography

FIB-Milled Nanopore Sensors for Tracking Virus Assembly

Use of Single Crystal Masks for Improved Mill Characteristics in High Current Xenon Plasma FIB instrumentation

The Neon Focused Ion Beam-Stabilizing the Emission Process

GFIS in Semiconductor Applications

Polarization Control via He-ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors

SIMS on the Helium Ion Microscope: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics

Flexible Grid Holder Enabling FIB-SEM Sample Prep and Analysis

Localization of Subsurface Structures for Site-Specific Cryo-FIB Lift-Out Preparation of Solid-Liquid Interfaces

Monolithic Multi-Grating Diffraction in a Convergent Electron Beam

FIB sample preparation for X-ray microscopy and ROI target cross-sectioning

Micromachining of Si3N4by Ga+-Ion Implantation and Dry Etching

FIB Tomography of Bacterial Biofilms Grown on Gold and Polystyrene

New Attempts on Preparing Tungsten FIB Sample

Novel TEM Specimen Preparation Using Multi-Source Focused Ion Beams for Real-Time Electrostatic Biasing Studies

Xe+ FIB Milling and Measurement of Amorphous Damage in Diamond

Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam

Fabrication of Frozen-Hydrated Sections by Focused Ion Beam(FIB) Method

MEMS-based Heating Element forin-situDynamical Experiments on FIB/SEM Systems

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Abstract