Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

X-Ray Imaging and Analysis

Abstract

Instrumentation for High Resolution Tomography for Characterization of Microstructures in Light-weight Alloys

Non-Invasive Multi-Scale Imaging and Modelling Using X-Ray Microscopy

Novel Methods for Hard X-ray Holographic Lensless Imaging

Windowless EDS Detection of N Lines and their Practical use in sub 2 kV X-ray mapping to Optimize Spatial Resolution

X-ray Mapping Characterisation of Materials that have a Large Dynamic Compositional Range

Detection of Osteogenesis in Explanted Synthetic Hydroxyapatite-Silicone Orbital Implants Using 3D X-Ray Microscopy

Novel, High Brightness X-ray Source and High Efficiency X-ray Optic for Development of X-ray Instrumentation

X-ray Mapping and Particle Searching with a Benchtop SEM

Automated Analysis of EDS Maps

Characterisation of Recycled Aggregate Concrete Through X-Ray Mapping

Analysis of Food Packaging Layered Polymers by SEM/EDS and Raman Spectroscopy

Quantification of Elemental Distribution in Spherical Core-Shell Nanoparticles Measured by STEM-EDX

Chemically Specific Buried Interface Imaging with a Coherent EUV Nanoscope

Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Abstract

Simple Specimen Preparation Method for In Situ Heating Experiments

Manipulation of Ceramic Fibers to EXpressLO™ Grids for FIB/TEM Analysis

Focused Ion Beam on Radioactive Specimens: Operational Challenges and Approach

Quantification of STEM-EDS With Ion Implantation

Nanoscale Analysis of Humidity Dependent Tonal Appearance of Platinum/Palladium Prints

FIB milling of polymer ceramic nanocomposites: far-reaching thermal artefacts and application to analysis of corrosion barrier coatings

Exploring Differences in Amorphous Layer Formation during FIB Sample Preparation between Metals and Non Metals

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

X-Ray Imaging and Analysis

Abstract

Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Abstract