Hostname: page-component-8448b6f56d-gtxcr Total loading time: 0 Render date: 2024-04-23T16:16:54.895Z Has data issue: false hasContentIssue false
  • English
  • Français

New Attempts on Preparing Tungsten FIB Sample

Published online by Cambridge University Press:  25 July 2016

Pengcheng Zhang ,
Pengtao Chai ,
Xinai Zhao  and
Zhiwei Shan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 174 - 175
Copyright
© Microscopy Society of America 2016 

References

[1] Mastenbr, A & Hamburg, G Journal of Physics E-Scientific Instruments 5 (1972). p. 10.CrossRefGoogle Scholar
[2] Bucki, M, Gemperle, A & Burkhanov, GS Metallography 13 (1980). p. 89.Google Scholar
[3] Reiser, J, Rieth, M & Dafferner, B Journal of Nuclear Materials 424 (2012). p. 197.Google Scholar
[4] Ibe, JP, Bey, PP & Brandow, SL Journal of Vacuum Science & Technology A 8 (1990). p. 3570.Google Scholar
[5] Ju, B-F, Chen, Y-L & Ge, Y Review of Scientific Instruments 82 (2011). p. 13707.CrossRefGoogle Scholar