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Polarization Control via He-ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors

Published online by Cambridge University Press:  25 July 2016

A. Belianinov ,
V. Iberi ,
A. Tselev ,
M. Susner ,
M. McGuire ,
D. Joy ,
S. Jesse ,
A. J. Rondinone ,
S. V. Kalinin  and
O. S. Ovchinnikova
A. Belianinov
Affiliation:
The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831
V. Iberi
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 Department of Materials Science and Engineering, University of Tennessee, Knoxville, Knoxville TN 37996
A. Tselev
Affiliation:
The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 Department of Physics and Astronomy, University of Tennessee, Knoxville, Knoxville TN 37996
M. Susner
Affiliation:
Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831
M. McGuire
Affiliation:
Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831
D. Joy
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 Department of Materials Science and Engineering, University of Tennessee, Knoxville, Knoxville TN 37996
S. Jesse
Affiliation:
The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831
A. J. Rondinone
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831
S. V. Kalinin
Affiliation:
The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831
O. S. Ovchinnikova
Affiliation:
The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 158 - 159
Copyright
© Microscopy Society of America 2016 

References

[1] Belianinov, A, He, Q, Dziaugys, A, Maksymovych, P, Eliseev, E, Borisevich, A, Morozovska, A, Banys, J, Vysochanskii, Y, Kalinin, SV, CuInP2S6 Room Temperature Layered Ferroelectric, Nano Letters 15(6), 3808–3814, 2015.Google Scholar
[2] Research was supported) and partially conducted (AFM, HIM) at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, US Department of Energy. This work was also supported (M. S., M. M.) and partially conducted (material growth) by the U.S. Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division.Google Scholar