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The Neon Focused Ion Beam-Stabilizing the Emission Process

Published online by Cambridge University Press:  25 July 2016

John Notte ,
Jason Huang  and
Rick Rickert
John Notte
Affiliation:
Carl Zeiss Microscopy. Ion Microscopy Innovation Center, Peabody, MAUSA
Jason Huang
Affiliation:
Carl Zeiss Microscopy. Ion Microscopy Innovation Center, Peabody, MAUSA
Rick Rickert
Affiliation:
Carl Zeiss Microscopy. Ion Microscopy Innovation Center, Peabody, MAUSA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 154 - 155
Copyright
© Microscopy Society of America 2016 

References

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