Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Big, Deep, and Smart Data in Microscopy

Abstract

Computational Methods for Large Scale Scanning Transmission Electron Microscopy (STEM) Experiments and Simulations

Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images

Less is More: Bigger Data from Compressive Measurements

Acquisition and Fast Analysis of Multi-Dimensional STEM Data

Reconstruction of Randomly and Partially Sampled STEM Spectrum-Images

Robust Nanostructure from High Throughput Powder Diffraction Data

Statistical Analyses of Electron Nanodiffraction Patterns to Examine Order and Structural Variability in Amorphous Materials

Multivariate Statistical Analysis of a Multimodal Diffraction and X-ray Spectral Series Data Set

Leveraging First Principles Modeling and Machine Learning for Microscopy Data Inversion

Accurate Diffraction Peak Identification for Scanning Electron Nanodiffraction Based on Automated Image Processing and Feature Detection

Autonomous Experimentation Applied to Carbon Nanotube Synthesis

G-mode - Full Information Capture Applied to Scanning Probe Microscopy

Combinatorial Microscopy in Liquids with Low Energy Electrons

Physics-Based Image Reconstruction of SiC Grain Boundaries

What Can We Learn from the Shapes of Secondary Electron Puddles on Direct Electron Detectors?

Rapid Measurement of I-V Curves via Complete Information Acquisition

Separation of Hard to Distinguish Phases in Automated Feature Analysis

Understanding and Exploiting the Interaction of Electron Beams With Low-dimensional Materials - From Controlled Atomic-level Manipulation to Circumventing Radiation Damage

Supervised Component Analysis for EELS Mapping

Processing a Five Dimensional X-ray Image: Big Data Challenges and Opportunities

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Big, Deep, and Smart Data in Microscopy

Abstract