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Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images

Published online by Cambridge University Press:  04 August 2017

Chenyu Zhang
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin, United States
Benjamin Berkels
Affiliation:
AICES Graduate School, RWTH Aachen University, Germany
Benedikt Wirth
Affiliation:
Applied Mathematics, University of Munster, Germany
Paul M. Voyles
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin, United States
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© Microscopy Society of America 2017 

References

[1] Yankovich, A. B., etal, Nat. Commun. 5 2014). p. 4155.CrossRefGoogle Scholar
[2] Sang, X. & LeBeau, J. M. Ultramicroscopy 138 2014). p. 28.CrossRefGoogle Scholar
[3] Jones, L., et al, Adv. Struct. Chem. Imaging 1 2015). p. 8.CrossRefGoogle Scholar
[4] Berkels, B. & Wirth, B. https://arxiv.org/abs/1612.08170 2016.Google Scholar
[5] Bals, S., et al, Phys. Rev. Lett. 96 2006). p. 096106.CrossRefGoogle Scholar
[6] Research at UW-Madison (CZ and PMV) was supported by the US Department of Energy (DE-FG02-08ER46547). Research at RWTH (BB) was supported by the Excellence Initiative of the German Federal and State Government. Research at Munster (BW) was supported by the Alfried Krupp Prize for Young University Teachers awarded by the Alfried Krupp von Bohlen und Halbach-Stiftung..Google Scholar
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Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images
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