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Reconstruction of Randomly and Partially Sampled STEM Spectrum-Images

Published online by Cambridge University Press:  04 August 2017

Etienne Monier ,
Thomas Oberlin ,
Nathalie Brun ,
Marcel Tence  and
Nicolas Dobigeon
Etienne Monier
Affiliation:
University of Toulouse, ffiJT/INP ENSEEIHT, F-31071 Toulouse Cedex, France
Thomas Oberlin
Affiliation:
University of Toulouse, ffiJT/INP ENSEEIHT, F-31071 Toulouse Cedex, France
Nathalie Brun
Affiliation:
Laboratoire de Physique des Solides, CNRS UMR 8502, Univ. Paris-Sud, Univ. Paris-Saclay, Bat. 510, 91405 Orsay Cedex, France
Marcel Tence
Affiliation:
Laboratoire de Physique des Solides, CNRS UMR 8502, Univ. Paris-Sud, Univ. Paris-Saclay, Bat. 510, 91405 Orsay Cedex, France
Nicolas Dobigeon
Affiliation:
University of Toulouse, ffiJT/INP ENSEEIHT, F-31071 Toulouse Cedex, France

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 170 - 171
Copyright
© Microscopy Society of America 2017 

References

[1] Boyer, C., Weiss, P. & Bigot, J. SIAM Journal on Imaging Sciences 7(2 2014). p 1080.CrossRefGoogle Scholar
[2] Wei, Q., et al, IEEE Transactions on Geoscience and Remote Sensing 53(7 2015). p 3658.CrossRefGoogle Scholar
[3] Beck, A. & Teboulle, M. SIAM journal on imaging sciences 2(1 2009). p 183.CrossRefGoogle Scholar
[4] NB thanks M. de Frutos, A. Tararan and A. Zobelli for providing samples and data.Google Scholar