27 results
Exploring Phonon Signals by High Energy / High Spatial Resolution EELS
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 66-67
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- August 2014
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High Energy and Spatial Resolution EELS Band Gap Measurements Using a Nion Monochromated Cold Field Emission HERMES Dedicated STEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 70-71
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- August 2014
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Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 72-73
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- August 2014
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High Energy Resolution Monochromated EELS-STEM System
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1124-1125
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- August 2013
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Monochromated STEM with high energy and spatial resolutions
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 330-331
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- July 2012
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The Southwestern Center for Aberration Corrected Electron Microscopy at Arizona State University: The Facility
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 408-409
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- July 2012
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El síndrome deficitario en la esquizofrenia: implicaciones para el tratamiento de los síntomas negativos
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- European Psychiatry (Ed.Española) / Volume 11 / Issue 4 / May 2004
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- 12 May 2020, pp. 219-224
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- May 2004
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Nanochemistry and Structure of Zr and Hf Based High Dielectric Constant Films
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 22 July 2003, pp. 466-467
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- August 2003
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Developing a Mechanistic Understanding of CO2 Mineral Sequestration Process for Power Plants
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 796-797
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- August 2002
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In Situ Observation of Nanocrystal Formation Via Dehydroxylation
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 438-439
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- August 2001
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Silicon Wafer Bonding: Effect of Wafer Surface Treatment on Interface Structure and Chemistry
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 1074-1075
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- August 2000
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Heterogeneous Formation of Oriented Silicon Oxynitride on α-Si3N4 Seed Crystals : Habits And Radiation Stability
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 778-779
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- August 1999
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Si/SiC UHV Direct Wafer Bonded Interface Structure
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- MRS Online Proceedings Library Archive / Volume 587 / 1999
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- 15 March 2011, O4.2
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- 1999
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Interfacial Segregation in Al-Cu-Mg Alloys
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 547-548
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- August 1997
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Crystallographic Origin of the Alternate Bright/Dark Contrast in 6H-SiC and other Hexagonal Crystal HREM Images
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- Microscopy and Microanalysis / Volume 2 / Issue 2 / April 1996
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- 31 July 2003, pp. 63-78
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- April 1996
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Chemistry, microstructure, and electrical properties at interfaces between thin films of platinum and alpha (6H) silicon carbide (0001)
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- Journal of Materials Research / Volume 10 / Issue 9 / September 1995
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- 03 March 2011, pp. 2336-2342
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- September 1995
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Chemistry, microstructure, and electrical properties at interfaces between thin films of titanium and alpha (6H) silicon carbide (0001)
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- Journal of Materials Research / Volume 10 / Issue 3 / March 1995
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- 03 March 2011, pp. 668-679
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- March 1995
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Ohmic Contact Formation to Doped GaN
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- MRS Online Proceedings Library Archive / Volume 395 / 1995
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- 21 February 2011, 861
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- 1995
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Chemistry, microstructure, and electrical properties at interfaces between thin films of cobalt and alpha (6H) silicon carbide (0001)
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- Journal of Materials Research / Volume 10 / Issue 1 / January 1995
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- 03 March 2011, pp. 26-33
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- January 1995
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Chemical Widths at Composite Interfaces: Relationships to Structural Widths and Methods for Measurement
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- MRS Online Proceedings Library Archive / Volume 357 / 1994
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- 15 February 2011, 271
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- 1994
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