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High Energy and Spatial Resolution EELS Band Gap Measurements Using a Nion Monochromated Cold Field Emission HERMES Dedicated STEM

Published online by Cambridge University Press:  27 August 2014

R.W Carpenter ,
H. Xie ,
S. Lehner ,
T. Aoki ,
J. Mardinly ,
M. Vahidi ,
N. Newman  and
F. A. Ponce
R.W Carpenter
Affiliation:
Dept. of Chemistry and Biochemistry, Arizona State University, Tempe, USA LeRoy Eyring Center for Solid State Science, Arizona State University, Tempe, USA
H. Xie
Affiliation:
School for Engr. of Matter, Transport, and Energy, Arizona State University, Tempe, USA
S. Lehner
Affiliation:
Dept. of Chemistry and Biochemistry, Arizona State University, Tempe, USA
T. Aoki
Affiliation:
LeRoy Eyring Center for Solid State Science, Arizona State University, Tempe, USA
J. Mardinly
Affiliation:
LeRoy Eyring Center for Solid State Science, Arizona State University, Tempe, USA
M. Vahidi
Affiliation:
School for Engr. of Matter, Transport, and Energy, Arizona State University, Tempe, USA
N. Newman
Affiliation:
School for Engr. of Matter, Transport, and Energy, Arizona State University, Tempe, USA
F. A. Ponce
Affiliation:
Dept. of Physics, Arizona State University, Tempe, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 70 - 71
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Carpenter, R W, et al, Micros. Micoranal. 18(Supp 2) (2012), p. 408.Google Scholar
[2] Krivanek, O L, et al, Microscopy 62 (2013), p. 3.Google Scholar
[3] Kimoto, K, et al, Micron 36 (2005), p.185.Google Scholar
[4] Egerton, R F Ultramicros. 107 (2007), p.575.Google Scholar