8 results
Properties of Cu3Ge Films for Contacts to Si and SiGe and Cu Metallization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 514 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 269
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- 1998
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Electrical and microstructural characteristics of Ge/Cu ohmic contacts to n-type GaAs
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- Journal:
- Journal of Materials Research / Volume 12 / Issue 9 / September 1997
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2325-2331
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- September 1997
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Characterization of Deep Level Defects in 4h and 6H SIC Via DLTS, SIMS And MEV E-Beam Irradiation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 519
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- 1996
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Structure and Electrical Properties of Cu/Ge Ohmic Contacts
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- Journal:
- MRS Online Proceedings Library Archive / Volume 402 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 541
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- 1995
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Electrical Transport Properties of Cu3Ge Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 320 / 1993
- Published online by Cambridge University Press:
- 03 September 2012, 269
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- 1993
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Increase in Schottky Barrier Height in the CoSi2/Si (100) Interface Caused by Hydrogen
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- Journal:
- MRS Online Proceedings Library Archive / Volume 281 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 629
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- 1992
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Schottky Barrier Heights of Refractory Metals on Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 71 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 273
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- 1986
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Growth Behavior of Au on Semiconductor and Insulating Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 47 / 1985
- Published online by Cambridge University Press:
- 22 February 2011, 27
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- 1985
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