6 results
Combined SEM-FIB-SPM-TOF-EDX-EBSD as a Multifunctional Tool
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 638-639
- Print publication:
- July 2012
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Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling
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- Journal:
- Microscopy Today / Volume 20 / Issue 2 / March 2012
- Published online by Cambridge University Press:
- 28 February 2012, pp. 12-16
- Print publication:
- March 2012
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Visible-Wavelength Laser Photodeposition of Cobalt Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 158 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 79
- Print publication:
- 1989
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GaAs Circuit Restructuring by Multi-Level Laser-Direct-Written Tungsten Process
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- Journal:
- MRS Online Proceedings Library Archive / Volume 75 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 651
- Print publication:
- 1986
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Laser Direct Write Technologies as Tools for Gate-Array Development**
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- Journal:
- MRS Online Proceedings Library Archive / Volume 29 / 1983
- Published online by Cambridge University Press:
- 21 February 2011, 55
- Print publication:
- 1983
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On the Minimal Graph with a Given Number of Spanning Trees
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- Journal:
- Canadian Mathematical Bulletin / Volume 13 / Issue 4 / December 1970
- Published online by Cambridge University Press:
- 20 November 2018, pp. 515-517
- Print publication:
- December 1970
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