27 results
The Measurement of Strain, Chemistry and Electric Fields by STEM based Techniques
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1414-1415
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- July 2017
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Nanoscale Strain Mapping in Embedded SiGe Devices by Dual Lens Dark Field Electron Holography and Precession Electron Diffraction
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1963-1964
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- August 2015
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Atomic Scale Analysis of Chemical Intermixing in MBE-Grown GaSb/InAs Superlattices Based on Z-Contrast Imaging
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1988-1989
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- August 2013
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Measuring Lattice Parameters and Local Rotation using Convergent Beam Electron Diffraction: One Step Further
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 710-711
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- August 2013
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Counting Tm Dopant Atoms in and Around GaN Dots using Scannning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1284-1285
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- July 2011
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Strain Measurement by Local Diffraction: NanoBeam Electron Diffraction (NBED) Compared to Convergent Beam (CBED) and Dark Holography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1068-1069
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- July 2011
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Measurement of Nanograin Orientations: Application to Cu Interconnects and Nanoparticle Phase Identification
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1094-1095
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- July 2011
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Measuring Strain in AlN/GaN Superlattices and Nanowires by NanoBeam Electron Diffraction
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 1388-1389
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- July 2011
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Stress Modulated Composition Fluctuation and Diffusion in near lattice match AlInN/GaN
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1020-1021
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- July 2009
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Strain Measurements at a NiSi/Si Interface Using STEM-CBED: A Quantifaction Method for Stress Relaxation During TEM Lamella Preparation
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 866-867
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- August 2003
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Influence of AlN Overgrowth on GaN Nanostructures Grown by Molecular Beam Epitaxy
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- MRS Online Proceedings Library Archive / Volume 798 / 2003
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- 01 February 2011, Y4.4
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- 2003
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Structural and Optical Properties of GaN Quantum Dots
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- MRS Online Proceedings Library Archive / Volume 798 / 2003
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- 01 February 2011, Y4.7
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- 2003
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Dislocation Networks Strain Fields Induced By Si Wafer Bonding.
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- MRS Online Proceedings Library Archive / Volume 673 / 2001
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- 18 March 2011, P6.9
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- 2001
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Piezoelectric Properties of GaN Self-Organized Quantum Dots
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 4 / Issue S1 / 1999
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- 13 June 2014, pp. 846-851
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- 1999
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Movpe Growth and Characterization of AlxGa1-xN Layers on Sapphire
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- MRS Online Proceedings Library Archive / Volume 468 / 1997
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- 10 February 2011, 23
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- 1997
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Controlling 2d/3d Growth of Gan by Molecular Beam Epitaxy: From Superlattices to Quantum Dots
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- MRS Online Proceedings Library Archive / Volume 482 / 1997
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- 10 February 2011, 205
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- 1997
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Evidence of 2D-3D transition during the first stages of GaN growth on AlN
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 2 / 1997
- Published online by Cambridge University Press:
- 13 June 2014, e20
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- 1997
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MOVPE Growth and Structural Characterization of AlxGa1−xN
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 2 / 1997
- Published online by Cambridge University Press:
- 13 June 2014, e27
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- 1997
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Correlation between surface morphologies and crystallographic structures of GaN layers grown by MOCVD on sapphire
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 1 / 1996
- Published online by Cambridge University Press:
- 13 June 2014, e33
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- 1996
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