Hostname: page-component-848d4c4894-tn8tq Total loading time: 0 Render date: 2024-06-19T04:55:12.203Z Has data issue: false hasContentIssue false
  • English
  • Français

Measuring Strain in AlN/GaN Superlattices and Nanowires by NanoBeam Electron Diffraction

Published online by Cambridge University Press:  08 April 2017

C Bougerol ,
A Béché ,
B Daudin  and
J Rouvière
C Bougerol
Affiliation:
CNRS, France
A Béché
Affiliation:
FEI Company, The Netherlands
B Daudin
Affiliation:
CEA-Grenoble, France
J Rouvière
Affiliation:
CEA-Grenoble, France

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1388 - 1389
Copyright
Copyright © Microscopy Society of America 2011