6 results
Optical Photothermal Infrared Microspectroscopy with Simultaneous Raman – A New Non-Contact Failure Analysis Technique for Identification of <10 μm Organic Contamination in the Hard Drive and other Electronics Industries
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- Journal:
- Microscopy Today / Volume 28 / Issue 3 / May 2020
- Published online by Cambridge University Press:
- 18 May 2020, pp. 26-36
- Print publication:
- May 2020
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Interface Analysis of Composites Using AFM-Based Nanoscale IR and Mechanical Spectroscopy
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- Journal:
- Microscopy Today / Volume 23 / Issue 2 / March 2015
- Published online by Cambridge University Press:
- 16 March 2015, pp. 38-45
- Print publication:
- March 2015
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Nanoscale Organic Defect Characterization with AFM-IR
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2056-2057
- Print publication:
- August 2014
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Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale
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- Journal:
- Microscopy Today / Volume 21 / Issue 6 / November 2013
- Published online by Cambridge University Press:
- 05 November 2013, pp. 18-24
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- November 2013
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Applications of AFM-IR—Diverse Chemical Composition Analyses at Nanoscale Spatial Resolution
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- Journal:
- Microscopy Today / Volume 20 / Issue 6 / November 2012
- Published online by Cambridge University Press:
- 02 November 2012, pp. 16-21
- Print publication:
- November 2012
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tudy of the Surface Cleaning Effects to the InGaAs Quantum Well Wires by Atomic Force Microscopy and Photoluminescence Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 259 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 317
- Print publication:
- 1992
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