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Nanoscale Organic Defect Characterization with AFM-IR

Published online by Cambridge University Press:  27 August 2014

Curtis Marcott ,
Michael Lo ,
Qichi Hu ,
Kevin Kjoller  and
Craig B. Prater
Curtis Marcott
Affiliation:
Light Light Solutions, Athens, GA, USA
Michael Lo
Affiliation:
Anasys Instruments, Santa Barbara, CA, USA
Qichi Hu
Affiliation:
Anasys Instruments, Santa Barbara, CA, USA
Kevin Kjoller
Affiliation:
Anasys Instruments, Santa Barbara, CA, USA
Craig B. Prater
Affiliation:
Anasys Instruments, Santa Barbara, CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 2056 - 2057
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Dazzi, A., et al, Opt. Lett. 30 (2005), p. 2388.Google Scholar
[2] Dazzi, A., et al, Ultramicroscopy 107 (2007), p. 1194.Google Scholar
[3] Dazzi, A., et al, Ultramicroscopy 108 (2008), p. 635.Google Scholar
[4] Marcott, C., et al, Appl. Spectrosc. 65 (2011), p. 1145.Google Scholar
[5] Dazzi, A., et al, Appl. Spectrosc. 66 (2012), p. 1365.Google Scholar
[6] Lu, F.and Belkin, M. Opt. Exp. 19 (2011), p. 19946.Google Scholar
[7] Lu, F., et al, Nat. Photonics, in press. doi:10.1038/nphoton.2013.373.Google Scholar
[8] The authors acknowledge funding from NSF-SBIR grant 0750512 and NSF-SBIR grant 0944400.Google Scholar