Microscopy and Microanalysis: Volume 23 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Abstract

A Comparison of Ga FIB and Xe-Plasma FIB of Complex Al Alloys

Focused Ion Beam Prepared Cross-Sectional Transmission Electron Microscopy Preparation On CaGe2 On Ge(111) Grown By Molecular Beam Epitaxy

Cross Sectional Analysis of Cation Doped Transition Metal Oxide Mesoporous Catalyst Materials

TEM Specimen Preparation for In Situ Heating Experiments Using FIB

Ga+ and Xe+ FIB Milling and Measurement of FIB Damage in Aluminum

Applications of an in-situ Low Energy Argon Ion Source for Improvement of TEM and SEM Sample Quality

Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation

Narrow-Beam Argon Ion Milling of Carbon-Supported Ex Situ Lift-Out FIB Specimens

Towards Automatic Lamella Thinning Using Live Thickness Measurements and Smart End-Point Detection

Optimizing Van der Waals Forces For FIB ex situ Lift Out

A Novel Approach in Sample Preparation of Li Content Materials for TEM Research

FIB/SEM Imaging of Microbial Induced Calcite Precipitation in Sandy Soil

Investigating 3D Printing with Microscopy and Spectroscopy Techniques

Analysis of Void Volume in Composite Electrode of All-solid-state Lithium-ion Battery Employing FIB-SEM and Union Operation Image Processing

Bridging Length Scales with 2D, 3D, and 4D Multiscale/Multimodal Microscopy

Abstract

Secondary Ion Mass Spectrometry in the TEM: Isotope Specific High Resolution Correlative Imaging.

Application of Serial Sectioning Microscopy to Additively Manufactured Metallic Samples

Solidification in 4D: from Dendrites to Eutectics

3D Imaging of Titanium Alloys Multi-Layered Structures (MLS) Via X-Ray Microscopy

Multimodal 3D Time-Lapse Studies of Corrosion Pitting and Corrosion-Fatigue Behavior in 7475 Aluminum Alloys

The Use of LOM, SEM, FIB and APT to Clarify the Sequences of Failure of a Hot Dip Galvanized Structural Steel Section

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Abstract

Bridging Length Scales with 2D, 3D, and 4D Multiscale/Multimodal Microscopy

Abstract