Microscopy and Microanalysis: Volume 27 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization

A new generic method to extract stoichiometric and dynamic information from the exit-wave for thin sample

Schlieren imaging of spatial magnetic fields by hollow-cone illumination

Correction for linear and non-linear distortions of STEM images

Growth mechanism of periodic nanopattern in metal-oxide composites

Discrimination between Coherent and Incoherent Interfaces using STEM Moiré

Oxidation of Co-Based Porous Nanoparticles Followed by HAADF/BF imaging

FCC and 4H structure coexistence in Ag nanoparticles determined through TEM imaging and a diffraction pattern indexing program (DPIP)

Atomic-scale imaging of flexoelectric polarization around engineered crack tips

Understanding Ferroelectricity in Nanometric Sodium Niobate by Differential Phase Contrast

Characterization of MoS2 Nanorods by Electron Microscopy

Structure and Morphology Changes of Zinc Oxide Nanoparticles

In-situ TEM observation of the growth process of carbon nanomaterials by laser irradiation

Controllable Growth of Copper on TiO2 Nanoparticles Through Coupled Effects of Solution Viscosity and Photoreduction Rate

Modern STEM EBIC: Emerging Modes and Methods

Imaging Soft and Hard Dielectric Breakdown in Resistive Switching

Atomic-scale Structural Imaging of Interfacial Defects in GaAs(001)-based Heterostructures

Ga interstitial stability and its effect on the electronic properties of β-(AlxGa1-x)2O3 alloy

Reducing Cracks and Delamination in Plasma-Sprayed Coatings of Calcia and Magnesia Stabilized-Zirconia.

Investigation of Defects in 2D Perovskite Oxide Nanosheets

Evidence of magnetic structure contribution to electron backscatter diffraction

Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization