Hostname: page-component-848d4c4894-jbqgn Total loading time: 0 Render date: 2024-06-23T16:51:00.621Z Has data issue: false hasContentIssue false
  • English
  • Français

A new generic method to extract stoichiometric and dynamic information from the exit-wave for thin sample

Published online by Cambridge University Press:  30 July 2021

Dirk Van Dyck ,
Fu-Rong Home ,
Christian Kisielowski  and
Stig Helveg
Dirk Van Dyck
Affiliation:
EMAT, Department of Physics, University of Antwerp, Belgium, United States
Fu-Rong Home
Affiliation:
Department of MSE, City University of Hong Kong, United States
Christian Kisielowski
Affiliation:
Lawrene Berkeley National Laboratory, The Molecular Foundry and Joint center for Artifical Photosynthesis, University of California, Berkeley, United States
Stig Helveg
Affiliation:
Center for Visualizing Catalytic Processes (VISION), Department of Physics, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark., Kongens Lyngby, Hovedstaden, Denmark

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2314 - 2316
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Barton, B., Jiang, B., Song, C. Y., Specht, P., Calderon, H., Kisielowski, C., Atomic resolution phase contrast imaging and in-line holography using variable voltage and dose rate. Microsc. Microanal. 18, 982–994 (2012).CrossRefGoogle ScholarPubMed
Hsieh, W. K., Chen, F. R., Kai, J. J., Kirkland, A. I., Resolution extension and exit wave reconstruction in complex HREM. Ultramicroscopy. 98, 99–114 (2004).CrossRefGoogle ScholarPubMed
Chen, F. R., Kisielowski, C., Van Dyck, D., 3D reconstruction of nanocrystalline particles from a single projection. Micron. 68, 59–65 (2015).CrossRefGoogle ScholarPubMed
Van Dyck, D., Jinschek, J. R., Chen, F. R., “Big Bang” tomography as a new route to atomic-resolution electron tomography. Nature. 486, 243–246 (2012).CrossRefGoogle ScholarPubMed
Van Dyck, D., Op De Beeck, M., A simple intuitive theory for electron diffraction. Ultramicroscopy. 64, 99–107 (1996).CrossRefGoogle Scholar
Van Dyck, D., in Handbook of Nanoscopy, Van Tendeloo, G., Van Dyck, D., Pennycook, S. J., Eds. (Wiley-VCH, 2012), pp. 45–79.CrossRefGoogle Scholar
Op De Beeck, M., Van Dyck, D., Coene, W., Wave function reconstruction in HRTEM: The parabola method. Ultramicroscopy (1996), doi:10.1016/0304-3991(96)00058-7.CrossRefGoogle Scholar
Chen, F. R., Van Dyck, D., Kisielowski, C., In-line three-dimensional holography of nanocrystalline objects at atomic resolution. Nat. Commun. 7, 1–11 (2016).Google ScholarPubMed
Chen, F.R, van Dyck, D., Kisielowski, C., Hansen, L. P., Barton, B., Helveg, S., submitted.Google Scholar