Microscopy and Microanalysis: Volume 27 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Defects in Materials: How We See and Understand Them

Point Defects and Alloy Incorporation in Ultrawide Bandgap β-(AlxGa1-x)2O3 Films

Probing point and planar defects in multiferroic YFeO3 thin films

Three-dimensional imaging of single dopants inside crystals using multislice electron ptychography

Electron Beam Control of Dopants in 2D and 3D Materials

Advanced Characterization of Components Fabricated by Additive Manufacturing

Additive Manufacturing of structural materials for nuclear application and rapid mesoscale mechanical testing

Post-Irradiation Analysis of Additively Manufactured Stainless Steel 316L Specimens

Advanced Characterization of Additively Manufactured 316L Stainless Steel for Nuclear Applications

Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM

In-situ electron microscopy study of non-volatile resistive switching in Mott insulator VO2

Investigations of magneto-elastic coupling in a multiferroic ferrite by in-situ precession diffraction

Direct observation of the perpendicular shape anisotropy and thermal stability of STT-MRAM nano-pillars examined by off-axis electron holography

In situ transmission electron microscopy of magnetic transitions

Lorentz Transmission Electron Microscopy Imaging of Magnetic Textures in MnBi

Microscopy & Spectroscopy of Energy Conversion and Storage Materials

In-situ Imaging of Electro-Chemo-Mechanical Degradation of High-Ni Content Cathode Materials

Surface Degradation Analysis of Commercial Nickel-rich Oxide Cathode Materials by Multiple Electron Microscopy Technologies

Asymmetric Discharge-Charge Reactions in Conversion-Type Electrodes for Lithium-Ion Batteries

Resolve cathode electrolyte interphase in lithium batteries with cryo-EM

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Increased efficiency of phase plate STEM using 2D detector

Dynamic Diffraction Lattice Phase Imaging Using DBI

Electric field mapping in CdSeTe solar cell using 4D-STEM

Probing atomic-scale symmetry breaking by rotationally invariant machine learning of 4D-STEM Data.

Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Defects in Materials: How We See and Understand Them

Advanced Characterization of Components Fabricated by Additive Manufacturing

Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM

Microscopy & Spectroscopy of Energy Conversion and Storage Materials

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines