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Probing point and planar defects in multiferroic YFeO3 thin films
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Defects in Materials: How We See and Understand Them
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Salmon, J. et al. , Journal of Mathematical Imaging and Vision 48 (2014) p. 279CrossRefGoogle Scholar
This material is based upon work supported by the National Science Foundation under MRSEC program, DMR 1419807.Google Scholar