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Microscopy and Microanalysis
Volume 11

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Microscopy and Microanalysis

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Nanostructured materials (54)

Quantitative Characterization, Simulation, and Representation of Microstructures (40)

Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley (38)

Breakthrough Microscopy in Catalysis, Nanoparticles and Energy (33)

High-Resolution STEM Analysis of Functional NanoMaterials (33)

Cell Pathology (32)

FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences (32)

Materials Research in an Aberration-Free Environment (30)

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday (30)

Tomography in Biological and Materials Sciences (28)

Microbiology, Pathogenesis and Pathology (24)

Quantitative X-ray Microanalysis (24)

Variable Pressure Electron Microscopy: Advances in the Nanotechnology and Biomaterials Age (24)

Cryo-EM of Molecular Assemblies (22)

Advances in In-situ Electron Microsocpy Technique and Applications (21)

Failure Analysis and Prevention (21)

Materials Applications (21)

Advances in Instrumentation and Technique (20)

Botany (20)

From the Static to the Dynamic: Correlative and High Resolution Biological Imaging and Labeling (20)

Presidential Symposium: The Golden Anniversary of Imaging Atoms (20)

Scanned Probe Microscopy and Nanoanalysis: Probing Properties at the Nanoscale (20)

Biological Applications (19)

Manipulation of Microstructure to Improve Properties and Performance (19)

Metals and Alloys (19)

Magnetic and Superconducting Materials (18)

Advances in Energy-Filtered Transmission Electron Microscopy (17)

Biological Specimen Preparation (17)

Characterizing the Limits of EBSD Analysis (16)

Microanalysis of Extraterrestrial Materials: New Techniques and Applications (16)

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Industry (16)

Scanning Electron Microscopy (SEM) (16)

Semiconductors (16)

Advanced Detectors (15)

Advances in Microstructurial Characterization Techniques (15)

Recent Progress in 3D Microscopy Imaging (14)

Spectral Imaging: Advances and Applications (14)

Advances in Ultrastructural Studies at Low Temperatures for Cryo TEM and SEM (13)

Interfaces (13)

Radiation Effects in Materials (13)

Reproduction and Development (13)

Structural Biology (13)

Biomaterials and Tissue Engineering (12)

Nano Scale Engineering & Self Assembly (12)

Vascular Corrosion Casting (12)

Modes of Cell-Cell and Cell-ECM Communication (11)

Digital Imaging (10)

Phase Transformations (10)

Green Fluorescent Protein and its Relatives (9)

Metallographic Techniques and Applications (9)

Advances in Fluorescence, Flow Cytometry and Cytomics (8)

Confocal Microscopy (8)

Microscopy and Imaging in the Digital Age (8)

Oxidation (8)

STEM Cells (8)

Films / Coatings (7)

Geology (7)

Ultrafast Electron Diffraction and Microscopy (7)

Composites (6)

Particle Analysis (6)

Specimen Preparation for Materials Sciences (6)

Technologists’ Forum: Low Temperature Technologies for Electron Microscopy (6)

Fluorescence (Förster) Resonance Energy Transfer (FRET) Microscopy (5)

Ceramics (4)

Core Facility Management (4)

Crystallography (4)

Polymers (4)

Ferroelectrics (3)

Corporate Session (2)

Industrial Real World Microscopy (2)

Building Order in Large Image Data Sets: Classification Techniques at Work! (1)

Computational Tools for Interpreting Electron Tomograms (1)

Confocal Microscopy System Performance: Spectroscopy and Foundations for Quantitation (1)

Erratum (1)

Improved Electron Microscopy with Monte Carlo Simulations (1)

In-situ Electron Microscopy: A Practical Tutorial (1)

Quantum Dots as Cellular Probes for Light and Electron Microscopy (1)

Theory and Applications of Focal-Series Reconstruction in HRTEM (1)

What is Fluctuation Electron Microscopy? (1)

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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< Back to all issues

Volume 11 - October 2005

Contents

Page 43 of 61

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Nano Scale Engineering & Self Assembly

Research Article

Spatially Confined Defects Induce Chemical Functionality of Anisotropic TiO2 Rods
B Rabatic, N Dimitrijevic, R Cook, Z Saponjic, T Rajh
Published online by Cambridge University Press:

01 August 2005, pp. 1406-1407
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Template Synthesis of Ordered Pt Nanorods in Porous Anodic Alumina
Y-M Wang, H-H Kuo, M Verbrugge, J Lian, L Wang, W Zhou
Published online by Cambridge University Press:

01 August 2005, pp. 1408-1409
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Importance of Aromatic Content for Peptide/Single-Walled Carbon Nanotube Interactions
V Zorbas, A L Smith, A Ortiz-Acevedo, H Xie, G R Dieckmann, R K Draper, R H Baughman, I H Musselman
Published online by Cambridge University Press:

01 August 2005, pp. 1410-1411
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Growth of Carbon Nanotubes from Supported Metal Catalysts
Z Aslam, B Rand, R Brydson, A Brown, X Li
Published online by Cambridge University Press:

01 August 2005, pp. 1412-1413
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Structural Characterization of Carbon Nanotube Arrays Formed in Ultra-Long Nanochannels of Porous Alumina Templates
J Y Miao, Y Cai, Y F Chan, N Wang
Published online by Cambridge University Press:

01 August 2005, pp. 1414-1415
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

High-Resolution STEM Analysis of Functional NanoMaterials

Research Article

Nanostructure Functionality through Aberration-Corrected STEM
S J Pennycook, M F Chisholm, A R Lupini, Y Peng, K van Benthem, A Borisevich, S D Findlay, M P Oxley, L J Allen, M Varela
Published online by Cambridge University Press:

01 August 2005, pp. 1416-1417
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Cobalt Disilicide/Silicon(001) Interfaces
A Bleloch, M Falke, U Falke
Published online by Cambridge University Press:

01 August 2005, pp. 1418-1419
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Interpretation of High Resolution Scanning Transmission Electron Microscope Images Based on Core Loss Spectroscopy
M P Oxley, S D Findlay, L J Allen
Published online by Cambridge University Press:

01 August 2005, pp. 1420-1421
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Nion UltraSTEM: An Aberration-Corrected STEM for Imaging and Analysis
N J Bacon, G J Corbin, N Dellby, P Hrncirik, O L Krivanek, A McManama-Smith, M F Murfitt, Z S Szilagyi
Published online by Cambridge University Press:

01 August 2005, pp. 1422-1423
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Z-contrast STEM Imaging of Rare Earths Segregation at Crystal/Intergranular Film Interfaces in Si3N4 CeramicI
N Shibata, G S Painter, P F Becher, S J Pennycook
Published online by Cambridge University Press:

01 August 2005, pp. 1424-1425
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Imaging Dislocations in Complex Materials
M F Chisholm, S Kumar, P M Hazzledine
Published online by Cambridge University Press:

01 August 2005, pp. 1426-1427
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

The Aberration Corrected JEM-2200FS at Brookhaven
Y Zhu, R F Klie, T Tomita, H Sawada, K Nagahata
Published online by Cambridge University Press:

01 August 2005, pp. 1428-1429
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Deconvolution Processing in Analytical STEM: Monochromator for EELS and Cs-Corrector for STEM-HAADF
K Ishizuka
Published online by Cambridge University Press:

01 August 2005, pp. 1430-1431
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Atomic Scale Studies of the Electronic Properties of CMR Manganese Oxides
M Varela, V Peña, Z Sefrioui, W Tian, A R Lupini, D G Mandrus, J Santamaria, S J Pennycock
Published online by Cambridge University Press:

01 August 2005, pp. 1432-1433
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

High Spatial and Energy Resolution EELS using a Monochromated STEM
N D Browning, R P Erni, A Ziegler, J C Idrobo, C F Kisielowski, R O Ritchie
Published online by Cambridge University Press:

01 August 2005, pp. 1434-1435
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

STEM- and EFTEM-Analysis of Nanomaterials at High Spatial and High Energy Resolution
W Grogger, B Schaffer, M Rogers, G Kothleitner, F Hofer
Published online by Cambridge University Press:

01 August 2005, pp. 1436-1437
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Radiolytic Transformation of TiO2 Revisited with High Resolution EELS
J Neff, R R Vanfleet
Published online by Cambridge University Press:

01 August 2005, pp. 1438-1439
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Novel Method for 3d Transition Metal L2,3 ELNES by First Principles Multi-Electron Theory
H Ikeno, T Mizoguchi, Y Koyama, I Tanaka
Published online by Cambridge University Press:

01 August 2005, pp. 1440-1441
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Why Some Interfaces can Never be Sharp
D A Muller, N Nakagawa, H Y Hwang
Published online by Cambridge University Press:

01 August 2005, pp. 1442-1443
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Chemical Bonding Information from ELNES using Bond Overlap Population Diagram
T Mizoguchi, I Tanaka
Published online by Cambridge University Press:

01 August 2005, pp. 1444-1445
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

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